During the project, several new measurement methods based on the application of conductive AFM probes and scanning microwave probes will be developed, which aim to standardize and disseminate to standardisation committees. Good Practice Guides (GPGs) and guidelines describing these methods and finally the submission of new work item proposals to international standardization committees, will be carried out as follows and will be made available here for download:

  • GPG 1 on Characterisation of probe wear in AFM based topography and nanomechanical and surface deformation measurements
  • GPG 2 on Quantitative nanomaterial testing using quasi-static and dynamic AFM methods (
  • GPG 3 on Methodology for MEMS-fixing platform and multi-probe measurements of individual NWs
  • GPG 4 on Thermal measurements on NWs