Several new measurement methods based on the application of conductive AFM probes and scanning microwave probes have been developed within the project. Good Practice Guides (GPGs) describing these methods are available for download:
- GPG 1 on Methodology for MEMS-fixing platform and multi-probe measurements of individual NWs
- GPG 2 on Thermal measurements on NWs
- GPG 3 on Characterisation of probe wear in AFM based topography and nanomechanical and surface deformation measurements - has been submitted to a journal and will be linked as soon as published
- GPG 4 on Quantitative nanomaterial testing using quasi-static and dynamic AFM methods