1. Microprobe tested in setup for roll measurement

    Linus Teir, Björn Hemming, VTT MIKES, Finland

2. New Printed Circuit Boards from GETec available for fast surface measurements with ultra-long cantilevers

    Oleg Domanov, GETec Microscopy GmbH, Vienna, Austria

3. In situ Microprobe Monitoring of Progressive wear on Alumina

    Mark Gee, Tim Kamps, John Nunn, Linda Orkney, National Physical Laboratory