The training is based on results from the EMRP project CRYSTAL. The project aims to develop a new type of dimensional standards for step height and lateral resolution measurements for scanning probe microscopy (SPM), interference microscopy for instance and related microscopy applications at the nanometer level. The design parameter of these new type standards are tailored to fill the present gap of sub-nanometer step height standards. Additionally lateral resolution standards between 5 nm and 30 nm are developed. These standards will help to improve the already high quality of high resolution, dimensional microscopy at nanoscale, to be ready for upcoming demands in the near future, reflecting the ongoing shrinking process in nanotechnology.
The manufacture of these new types of standards employs self-organisation principles of nature. New methodology for the application and new mathematical approaches are also developed to get the best result with the new standards. The training will be divided into two sessions with the goal of providing end-users with practical information regarding self-assembled nano-scale standards at the sub- and small-nanometer level (training on crystalline standards) and for the nanometer level (training on organic standards).
Dimension: ≤ 5nm
Tuesday, September 20, 2016, 13:00-17:00
-Sample Manufacturing and Production Methods
-Experimental Work with Standards
-Data Evaluation
Dimension: ≈ 30nm
Wednesday, September 21, 2016, 9:00-13:00
-Sample Manufacturing and Production Methods
-Experimental Work with Standards
-Data Evaluation
-Future Developments: DNA Nano-Origami
- Microscopy vendors
- Users of high-resolution microscopes
- Members of standardization bodies
- Scientists
- Quality managers
Please register for one or both trainings here on the website. There is no registration fee.
We look forward to welcoming you in Braunschweig.