2013

Busch I:  JRP61 Crystal:  Crystalline surfaces, self assembled structures and nano-origami as length standards in (nano)metrology.  Poster presented at EURAMET TC-Length Workshop, October 22, 2013, Braunschweig, Germany.

2014

Prokop Hapala, Ruslan Temirov, F. Stefan Tautz, Pavel Jelínek:  Origin of high-resolution IETS-STM images of organic molecules with functionalized tips.  Published in Physics Review Letters, 113, 226101 (2014).  DOI: 10.1103/PhysRevLett.113.226101.

Ferrarese Lupi F, Giammaria TJ , Seguini G, Laus M, Enrico E, De Leo N, Boarino L, Ober CK, Perego M: Thermally induced orientational flipping of cylindrical phase diblock copolymers. Published in Journal of Materials Chemistry C06, Jan 2014. DOI: 10.1039/c3tc32283a.

Perego M:  Rapid thermal processing of self-assembling block copolymer thin films on flat surfaces and topographically defined patterns.  Presentation at APS March Meeting, March 3-7, 2014, Denver, USA.

Telychko M, Berger J, Majzik Z, Jelenek P, Svec M:  Graphene on SiC(0001) inspected by dynamic atomic force microscopy at room temperature.  Poster presented at NC-AFM Confernce, August 4-8, 2014, Tsukuba, Japan.

Perego M:  Self-assembly for Nanoelectronics.  Presentation at IEEE-NMDC 2014, October 12-15, 2014, Aci Castello, Italy.

Charvátová Campbell A:  Uncertainties of AFM stepheight measurements using DFT.  Presentation at NANOCON, November 5-7, 2014, Brno, Czech Republic.

Hapala P, Temirov F, Tautz S, Jelínek P:  Origin of high-resolution IETS-STM images of organic molecules with functualized tips.  PhysRevLett.113.226101,  November 28, 2014.

2015

Korpelainen V,  Seppä J, Linko V, Kostiainen M, Lassila A:  Novel traceable transfer standards for nanometrology: atomic steps and nano-origami structures.  Presentation at Physics Day 2015, March 17-19, 2015, Helsinki, Finland.

Jelinek P: What can we learn from high resolution AFM/STM images.  Presentation at SPM Workshop, March 25-27, 2015, Czech Republic.

Charvátová Campbell, A:  Study of uncertainty measurement of monoatomic step on Si 7×7 using DFT.  Presentation at SPM Workshop, March 25-27, 2015, Czech Republic.

Boarino L:  Nanofabrication and surface metrology.  Presentation at MESPEC, March 27, 2015, Italy.

Yacoot A:  AFM Metrology.  Presentation at Nottingham University Seminar, April 1, 2015, United Kingdom.

Linko V:  DNA Origami as the Assembly Toolkit in Nanotechnology: Cellular Delivery Vehicles, Nanoreactors, Metallic Nanostructures. Presentation at FNANO15, April 13-15, 2015, Utah, United States.

Kostiainen M:  Crystalline Assemblies from Nanoparticles and Patchy Protein Cages.   Presentation at FNANO15, April 13-15, 2015, Utah, United States.

Jelinek P:  High resplution AFM/STM images on molecules.  Presentation at TUM Munchen Colloquium, April 16, 2015, Munchen, Germany.

Yacoot A:  Traceablity for nanometrology.  Presentation at Ultraprecision manufacturing, May 1, 2015, United Kingdom.

B. Shen, V. Linko, K. Tapio, M. Kostianen, J. Toppari:  Custom-shaped metal nanostructures based on DNA origami silhouettes.  Published in Nanoscale, 2015, 7, 11267-11272.  DOI:  10.1039/ c5nr02300a.

V. Linko, B. Shen, K. Tapio, M. Kostianen, S. Tuukkanen: One-step large-scale deposition of salt-free DANN origami nanostructures.  Published in Scientific Reports 5, 15634 (2015).  DOI: 10.1038/ srep15634.

F. Ferrarese Lupi, G. Aprile, T. J. Giammaria, G. Seguini, G. Zuccheri, N. De Leo, L. Boarino, M. Laus, M. Perego:  Thickness and Microdomain Orientation of Asymmetric PS-b-PMMA Block Copolymer Films Inside Periodic Gratings.  Published in ACS Appl. Mater. Interfaces, 2015, 7 (42), pp 23615-23622 (2015). DOI: 10.1021/acsami.5b07127.

Boarino, L:  Nanofabrication by supramolecular self-assembly: from micro to nano.  Presentation at Materials Research Society Meeting, Brasil, September 29, 2015.

Jelinek, P:  What can we learn from high-resolution AFM/ STM images: mapping molecular electrostatic potential.  Presentation at ECSCD-12, October 19-21, 2015, Italy.

Lenck, O:  Sub-nanometre standards for step-height measurements based on self-assembled silicon surfaces. Poster presented at Nanotech ITALY 2015, November 25-27, 2015, Bologna, Italy.

Busch, I: Novel  Approach for Dimensional Standards at Nanoscale by Self-Organization of Nature.  Presentation at Nanotech ITALY 2015, November 25-27, 2015, Bologna, Italy.

2016

J. Garnaes, M.H. Madsen, A. Torras-Rosell, A. Yacoot, M. Lazzerini, V. Korpelainen, O. Lenck, I. Busch, L. Koenders, P. Klapetek, M. Valtr, Good practice guide on crystalline step height standards (2016)