20IND08 MetExSPM

Today, complex nanostructures and nanodevices are used in photonics, quantum technology and nanoelectronics, and increasingly in healthcare and in novel materials research. Fast, accurate and traceable High-Speed Scanning Probe Microscopy (HS‑SPM) has great potential for use in identifying faulty nano‑products across multistage production processes and offers the benefits of increased productivity and reduced wastage. Conventional scanning probe microscopy (SPM) is either too slow to cover large sample areas or if fast, it lacks positioning accuracy. This project will develop essential scanning probe microscope components and ultimately a validated and traceable prototype HS-SPM measurement system suitable for use in industrial measurements.