Webinars on Nanometrology | Dec 7, 2023 & Jan 8, 2024
Instrumentation - December 7, 2023 9:00-11:30 (CET)
This webinar was focused on nanometrology instrumentation, especially high-speed long-range scanning probe microscopes (SPM). The recorded presentations can be viewed here:
- MetExSPM Project: development of traceable methods for high-speed and large-range SPM, V. Korpelainen / VTT
- Active Cantilevers, I. Rangelow / nano analytik GmbH
- A high-speed large-range SPM scanner based on a magnetic levitation stage and piezo scanners, R. Krueger / Physik Instrumente (PI) GmbH
- Data processing in metrological high-speed SPM, P. Klapetek / CMI
- A high-speed large-range SPM prototype, J. Thiesler / PTB
- Applications of open hardware Gwyscope controller for adaptive and high-speed SPM, M. Valtr / CMI
- Grating pitch data evaluation methods-good parameter choices and accuracy, D. Necas / Brno University of Tech
Applications - January 8, 2024 9:00-11:30 (CET)
This second webinar focused on applications of nanometrology, scanning probe microscopes (SPM) and nanopositioning & nanomeasuring machines. The recorded presentations can be viewed here:
- MetExSPM Project: development of traceable methods for high-speed and large-range SPM, V. Korpelainen / VTT
- Application of nanometrology to improve nanopositioning stages in high-speed AFM, E. Heaps / NPL
- Traceable surface and nanometrology: nanopositioning & nanomeasuring machine at PTB, G. Dai / PTB
- Application of active piezoresistive cantilevers in high-eigenmode surface imaging, T. Gotszalk / WUST
- Implementation of interferometers in a commercial SPM to extend positioning capabilities, B. Sauvet / VTT
- Compressed sensing method for scanning probe microscopy based on Gaussian processes, R. Slesinger / CMI
- Application of active AFM cantilever systems in nanopositioning and nanomeasuring machines, E. Manske / TU Ilmenau
More information on both webinars and the agenda to these online events can be found in this flyer.