Selected publications by consortium members during and prior to this project

References

•	D. Zhao, JA Ferreira, H. Polinder, A. Roc'h and F. Leferink Noise propagation path identification of variable speed drive in time domain via common mode test mode Power Electronics and Applications, 2007 European Conference on , page 1--8. IEEE 2007
•	D A Humphreys and L K J McInnes Assessment of NPL's capability for traceable WCDMA EVM measurements of sources and receivers NPL REPORT I2D TQEM (RES) 004 NPL, 2007
•	C. Jastrow, K. M, R. Piesiewicz, T. K, M. Koch and T. Kleine-Ostmann 300 GHz Transmission System Electron. Lett. 44, 213 (2008)
•	T. K, M. Jacob, R. Piesiewicz and J. Sch An Integrated Simulation Environment for the Investigation of Future THz Communication Systems Simulation 84, 123 (2008)
•	Robert T. Dickerson David A. Humphreys and Ann Yanecek Making traceable EVM measurements with digital oscilloscopes Agilent Measurement Journal (4), 46-51 (2008)
•	S. Iezekiel D. A. Humphreys Measurement of microwave behavior in optical links IEEE Microwave Magazine 9 (3), 100 - 120 (2008)
•	M. R. Harper, L. K. J. McInnes, J. Miall D. A. Humphreys Strategy for Traceability of Complex Modulated Signals Using RF Waveform Metrology 2008 URSI General Assembly (2008)
•	M R Harper, D A Humphreys L K J McInnes Dual IQ for complex RF demodulation ARMMS conference Steventon, UK 2008
•	G. Watkins, K. Morris, J. Miall D. A. Humphreys RF Waveform metrology for characterization of non-linear amplifiers 72nd ARFTG Conference Portland, Oregon 2008
•	D. Zhao, B. Ferreira, A. Roc'h and F. Leferink Hierarchical emc analysis approach for power electronics applications Power Electronics Specialists Conference (PESC) , page 1176--1182. IEEE 2008
•	M R Harper, L K J McInnes D A Humphreys and J Miall Report to collaborators: progress of NPL wireless communications project,stage 1 NPL REPORT TQE (RES) 006 NPL, 2008
•	M. Bieler, M. Spitzer, K. Pierz and U. Siegner Improved Optoelectronic Technique for the Time-Domain Characterization of Sampling Oscilloscopes IEEE Trans. Instrum. Meas. 58, 1065-1071 (2009) DOI: 10.1109/TIM.2008.2009916

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