Traceable characterisation of thin-film materials for energy applications
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Title:
Ellipsometric porosimetry on pore-controlled TiO
2
layers
Author(s):
Dana Maria Rosu
,
Erik Ortel
,
Vasile-Dan Hodoroaba
,
Ralph Kraehnert
and
Andreas Hertwig
Journal:
Applied Surface Science
Year:
2016
Month:
November
Day:
9
DOI:
10.1016/j.apsusc.2016.11.055
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