ENG53 ThinErgy

Scientific and technical objectives

This JRP aims to solve those challenges and develop the necessary multi-faceted metrology framework to ensure an energy efficient Europe and to extend Europe’s leadership in energy technology and innovation. The ambitious goal of the JRP is to develop complementary metrology tools for thin film characterisation, including:

  • Development of models for the interpretation of advanced materials measurements and their correlation to product performance.
  •  Traceable determination of the correlation between material composition and electronic structure over a broad spectral range. This should include the production of reference standards, calibration samples and reference measurement techniques.
  • Validation of measurement techniques for elemental depth, selectivity and sensitivity for thin film energy materials such as novel compound materials with matrix elemental depth gradients, organic/inorganic hybrids, multi-layered structures and nano-structured surfaces, layers and interfaces.
  • Development of validated methods for the thermal characterisation of thin films as a function of temperature and for multi-parameter characterisation of energy thin film materials under specific stress conditions.
  • Development of large-area characterisation methods for process optimisation in thin-film energy material production, including fast contact and non-contact methods.



Expected results and potential impact

As an output, this JRP will deliver novel measurement prototypes, new traceable facilities, reference materials and advanced materials datasets. Innovative measurement protocols and good practice guides will be created and disseminated to stakeholders and relevant standards bodies. Efficient knowledge transfer mechanisms will be used to disseminate JRP results and ensure impact, including workshops, training and a Opens internal link in current windowstakeholder e-forum.

In order to achieve these goals, this JRP has brought together a select group of JRP-Partners from European metrology institutes, industry and R&D centres. It has also attracted supporters and collaborators that will form the core of the JRP Stakeholder advisory committee. These include not only end-users, instrument manufactures and materials producers as individual institutions but also large stakeholder associations. Such a group will provide a diversity of end-user needs and will help maximise the JRP’s impact to support a safe and sustainable low carbon economy in Europe.