Traceability of sub-nm length measurements
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Title:
A method for linearization of a laser interferometer down to the picometre level with a capacitive sensor
Author(s):
J. Seppä
,
V. Korpelainen
,
M. Merimaa
,
G. B. Picotto
and
A. Lassila
Journal:
Meas. Sci. Technol.
Year:
2011
Volume:
22
Pages:
094027
DOI:
10.1088/0957-0233/22/9/094027
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