Subnano: Publications

References

	B. Andreas, G. Mana and C. Palmisano Vectorial ray-based diffraction integral J. Opt. Soc. Am. A 32 (8), 1403-1424 (2015) DOI: 10.1364/JOSAA.32.001403
	C. Falldorf and R. B. Bergmann Single shot lateral shear interferometer with variable shear Opt. Eng. 54 (5), 054105 (2015) DOI: 10.1117/1.OE.54.5.054105
	C. Falldorf, M. Agour and R. B. Bergmann Digital holography and quantitative phase contrast imaging using computational shear interferometry Opt. Eng. 54 (2), 024110 (2015) DOI: 10.1117/1.OE.54.2.024110
	D. Voigt and A. S. van de Nes Practical Fabry-Perot displacement interferometry in ambient air conditions with subnanometer accuracy SPIE Proceedings 9203, 920308 (2014) DOI: 10.1117/12.2060537
	R. Nojdelov and S. Nihtianov Highly-stable Electronic Sensor Interface for Capacitive Position Measurement Key Engineering Materials 613, 51-57 (2014) DOI: 10.4028/www.scientific.net/KEM.613.51
	B. Andreas, G. Mana, E. Massa and C. Palmisano Modelling laser interferometers for the measurement of the Avogadro constant SPIE Proceedings 8789, 87890W (2013) DOI: 10.1117/12.2020282
	D. Voigt and R. Bergmans Dimensional stability validation and sensor calibration with sub-nanometer accuracy ISCO2012 Proceedings (123) (2012)
	B. Andreas, K. Fujii, N. Kuramoto and G. Mana The uncertainty of the phase-correction in sphere-diameter measurements Metrologia 49, 479-486 (2012) DOI: 10.1088/0026-1394/49/4/479
	C. Weichert, P. Köchert, R. Köning, J. Flügge, B. Andreas, U. Kuetgens and A. Yacoot A heterodyne interferometer with periodic nonlinearities smaller than ±10 pm Meas. Sci. Technol. 23, 094005 (7pp) (2012) DOI: 10.1088/0957-0233/23/9/094005
	M. Pisani, A. Yacoot, P. Balling, N. Bancone, C. Birlikseven, M. Celik, J. Flügge, R. Hamid, P. Köchert, P. Křen, U. Kuetgens, A. Lassila, G. B. Picotto, E. Sahin, J. Seppä, M. Tedaldi and C. Weichert Comparison of the performance of the next generation of optical interferometers Metrologia 49, 455-467 (2012) DOI: 10.1088/0026-1394/49/4/455
	A. Yacoot and U. Kuetgens Sub-atomic dimensional metrology: developments in the control of x-ray interferometers Meas. Sci. Technol. 23, 074003 (7pp) (2012) DOI: 10.1088/0957-0233/23/7/074003
	M. Celik, R. Hamid, U. Kuetgens and A. Yacoot Picometre displacement measurements using a differential Fabry-Perot optical interferometer and an x-ray interferometer Meas. Sci. Technol. 23, 085901 (6pp) (2012) DOI: 10.1088/0957-0233/23/8/085901

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