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Virtual Training course "Metrology for measurement of nanoparticle size by electron microscopy & atomic force microscopy"

VSL Dutch Metrology Institute invites you to participate in a virtual half-day free training course to be held at VSL in Delft, The Netherlands during 27 October 2020. The virtual training course will focus on the challenges associated with the preparation, measurement and data analysis of nano particle reference materials within the framework of the European Metrology Programme for Innovation and Research (EMPIR) project nPSize. The metrology of SEM, TEM and AFM methods for particle imaging will be presented as well as a hybrid metrology approach, standardization and machine learning for advanced analysis of measurement data. The virtual training course is targeted at PhD students, reference materials providers, accredited laboratories and instrument manufacturers.