Abstract
To foster the digital transformation in the quality infrastructure towards a "
QI-Digital", PTB has initiated the development for a proof-of-concept of a European digital quality infrastructure for innovative products and services. Its foundation lies in a trustworthy, distributed platform designed to support and streamline processes in the quality infrastructure by joining existing infrastructures and databases, and to provide a single-point-of-contact for all stakeholders.
Within this distributed infrastructure, reference architectures as well as novel services can be developed. The initial outcomes of this initiative will be demonstrators. These demonstrators will serve as blueprints for the individual national platforms to attract and to integrate further stakeholders and services.
Contact and Technical Support
Contact: 
Sascha Eichstädt and Alexander Oppermann
Technical Support: mc-dev(at)ptb.de
Publications
General Topics
- Thiel, Florian; Wetzlich, Jan; The European Metrology Cloud: Impact of European Regulations on Data Protection and the Free Flow of Non-Personal Data, 19th International Congress of Metrology, 01001 (2019), DOI: https://doi.org/10.1051/metrology/201901001,
- Thiel, Florian; Esche, Marko; Grasso Toro, Federico; Peters, Daniel; Oppermann, Alexander; Wetzlich, Jan; Dohlus, Maximilian: "A Digital Quality Infrastructure for Europe: The European Metrology Cloud" (2018) ; DOI: 10.7795/310.20170404
- Metrologische IT, "Digitalisierung im gesetzlichen Messwesen", PTB-Mitteilungen 04/2016 und PTB-Mitteilungen 01/2017
- Florian Thiel: "Digital transformation of legal metrology - The European Metrology Cloud", OIML Bulletin, vol. LIX, 2018(1), pp. 10-21
GAIA-X and the Metrology Cloud
- GAIA-X: A Pitch Towards Europe, BMWi 2020,
- F. Thiel and J. Nordholz, "Quality Infrastructure Digital (QI-Digital)", BMWi, 2020
Specific Topics
Work Package 1: Trustworthy Metrological Platform
- M. Dohlus, M. Nischwitz, A. Yurchenko, R. Meyer, J. Wetzlich and F. Thiel, Designing the European Metrology Cloud, OIML Bulletin, vol. LXI, 2020(1), pp. 8-17,
- Dohlus M. , Nischwitz M., Yurchenko A., Wetzlich J., Integrated Information Systems: Design-Options for Consortial Plattforms, PTB-Metrology-Cloud Whitepaper 2018
- Wetzlich J, Nischwitz M, Thiel F, Seifert J.-P., A Modular Testbed for Intelligent Meters and their Ecosystem, FedCSIS 2017, ACSIS, Vol. 13, pp. 119–125, DOI: 10.15439/2017F556, ISSN 2300-5963
Work Package 2: Reference Architectures
- A. Oppermann: "Secure Cloud Computing in Legal Metrology", Dissertation, TU Berlin, Germany, 2019
- Oppermann A, Toro FG, Thiel F, Seifert J-P. Secure Cloud Computing: Reference Architecture for Measuring Instrument under Legal Control. Security and Privacy 2018; e18.
- D. Peters, P. Scholz, F. Thiel, Software Separation in Measuring Instruments through Security Concepts and Separation Kernels, Acta IMEKO, vol. 7, no. 1, article 4, March 2018, identifier: IMEKO-ACTA-07 (2018)-01-04, ISSN: 2221-870X
- A.Oppermann, F. Grasso Toro, A. Yurchenko, J.-P.Seifert, Secure Cloud Computing: Communication Protocol for Multithreaded Fully Homomorphic Encryption for Remote Data Processing in IEEE International Symposium on Parallel and Distributed Processing with Applications (IEEE ISPA 2017) (pp. 503-510), DOI: 10.1109/ISPA/IUCC.2017.00084
- A. Oppermann, F. Grasso-Toro, F. Thiel, and J.-P- Seifert: Anomaly Detection Approaches for Secure Cloud Reference Architectures in Legal Metrology. In Proceedings of the 8th International Conference on Cloud Computing and Services Science (CLOSER 2018), pages 549-556, ISBN: 978-989-758-295-0,
- Peters D, Peter M, Seifert J-P, Thiel F.: A Secure System Architecture for Measuring Instruments in Legal Metrology. Computers. (2015); 4(2):61-86. doi:10.3390/computers4020061
Work Package 3: Technology based Metrological Support Services
- Peters D, Wetzlich J, Thiel F, Seifert Jean-Pierre: Blockchain Applications for Legal Metrology, IEEE International Instrumentation & Measurement Technology Conference (I2MTC), May 14-17, 2018, Houston, Texas
Work Package 4: Data based Metrological Support Services
- M. Esche and F. Thiel: Software Risk Assessment for Measuring Instruments in Legal Metrology, Federated Conference on Computer Science and Information Systems (FedCSIS), pages 1113 – 1123, DOI: dx.doi.org/10.15439/978-83-60810-66-8, ISSN 2300-5963, (2015)