Traceability of sub-nm length measurements
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Title:
Design and calibration of a parallel-moving displacement generator for nano-metrology
Author(s):
H. Haitjema
,
N. Rosielle
,
G. Kotte
and
H. Steijaert
Journal:
Meas. Sci. Technol.
Year:
1998
Volume:
9
Pages:
1098-1104
DOI:
10.1088/0957-0233/9/7/016
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