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Title:

Low-frequency Noise Measurement of Highly Stable Charge-meter
Author(s): S. Nihtianov and X. Guo
Year: 2009
Book title: Proc., IEEE Africon 2009
Event name: Africon 2009
Event place: Nairobi, Kenya
Event date: 2009 - 09 - 23-25
ISBN: 978-1-4244-3919-5

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