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NanoScale 2010
9th Seminar on Quantitative Microscopy (QM)
and 5th Seminar on Nanoscale Calibration Standards and Methods
Dimensional and related measurements
in the micro- and nanometre range
Oct 27th - 29th, 2010
together with

Co-Nanomet - Workshops
Thin films
SPM SEM and Critical Dimension

NanoTRACE - Workshop
Location:
Organized by:

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