NanoScale 2010

9^th Seminar on Quantitative Microscopy (QM)
and
5^th Seminar on Nanoscale Calibration Standards and Methods

Dimensional and related measurements
in the micro- and nanometre range

Oct 27^th - 29^th, 2010 

together with

Co-Nanomet - Workshops

Thin films

SPM SEM and Critical Dimension

NanoTRACE - Workshop

Location:                      

Hotelinternational ,Brno Czech Republic

NanoScale 2010 - Info:  Flyer.pdf 

Organized by: