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Elemental depth profiling in TCO thin film by XRR-GIXRF combined analysis

Author(s): Helene Rotella, B. Caby, Yves Ménesguen, Y. Mazel, A. Valla, D. Ingerle, Blanka Detlefs, Marie-Christine Lépy, A. Novikova, G. Rodriguez, Christina Streli and Emmanuel Nolot
Journal: Spectrochimica Acta Part B: Atomic Spectroscopy
Year: 2017
Month: June
Day: 21
DOI: 10.1016/j.sab.2017.06.011

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