EXSA Workshop on quantitative methods in X-ray Spectrometry and FP meeting, Berlin, GermanyFor further upcoming events please check the website of the 
succeeding HyMet project.
Proceedings of the 2017 E-MRS Spring Meeting Symposium S ALTECH 2017 – Analytical techniques for precise characterization of nanomaterials are published in physica status solidi c (Volume 14, Issue 12).
While various techniques exist for the characterization of compositional depth profiles of compound thin films - such as GIXRF, EDX, SIMS, GDOES just to name a few - choices for in-depth characterization of crystallographic...
The ThinErgy project also uses twitter to provide up-to-date information. You can follow us @ThinErgy.
There is an oral presentation of our Partner PTB on "Ageing of organic photovoltaic thin layers by monochromatic UV/VIS irradiation investigated by photoelectron spectroscopy (UPS, XPS)" at the 16th European Conference...
There is a presentation of our REG-Partner Aalto University on "Silicon surface passivation with atomic layer deposited aluminum nitride" at the 28th International Conference on Defects in Semiconductors (ICDS-2015) in...
There is an oral presentation of our Partner PTB on "Degradation of organic thin films by monochromatic UV/VIS irradiation investigated by photoelectron spectroscopy...
Pan-European research project for Traceable characterisation of thin-film materials for energy applications The Kick-Off Meeting for this project will take place at NPL, London, UK July 24/25 2014.
ALTECH Symposium at E-MRS Spring Meeting with stakeholder meeting, Strasbourg, Francemicro photonics, Berlin, GermanyFundamental Parameter workshop with stakeholder meeting, Surrey, UKEuropean Optical Society Bi-Annual Meeting, Berlin, GermanyXIII Symposium on Temperature and Thermal Measurements in Industry and Science TEMPMEKO 2016, Zakopane, PolandEuropean Conference on X-Ray Spectrometry, Gothenburg, Sweden7th International Conference on Spectroscopic Ellipsometry (ICSE-7), Berlin, GermanyWorkshop on advanced optical measurements with stakeholder meeting, Berlin, GermanyTHz to Soft X-ray Workshop, Berlin, GermanyInternational Summit on HOPV Stability, Rio de Janeiro, Brazil16th European Conference on Applications of Surface and Interface Analysis ECASIA'15, Granada, Spain 17th International Congress of Metrology, Paris, FranceEU PVSEC 2015, Hamburg, Germany28th International Conference on Defects in Semiconductors, Espoo, FinlandSynchrotron Radiation Instrumentation (SRI 2015), New York, USAInternational Symposium on Flexible Organic Electronics, Thessaloniki, GreeceFundamental Parameter workshop, Lisbon, PortugalAdvanced School: Thermal Measurements & Inverse Techniques
– 6th edition, Biaritz, France9th Workshop Ellipsometry, Enschede, the NetherlandsHZB BESSY II User Meeting, Berlin, GermanyNanotechITALY2014, Venice, ItalyAnnual Meeting of the European Optical Society EOSAM, Berlin, Germany20th European Conference on Thermophysical Properties ECTP 2014, Porto, Portugal