Traceability of sub-nm length measurements
Home
The Project
Work Packages
The Consortium
Publications
Downloads
Contact
Data Protection
Imprint
Publication single view
Title:
Sub-atomic dimensional metrology: developments in the control of x-ray interferometers
Author(s):
A. Yacoot
and
U. Kuetgens
Journal:
Meas. Sci. Technol.
Year:
2012
Volume:
23
Pages:
074003 (7pp)
DOI:
10.1088/0957-0233/23/7/074003
Back to the list view