Traceability of sub-nm length measurements
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Title:
Measurements of Picometre non-linearity in an optical grating encoder using x-ray interferometry
Author(s):
A. Yacoot
and
N. Cross
Journal:
Meas. Sci. Technol.
Year:
2003
Volume:
14
Pages:
148-152
DOI:
10.1088/0957-0233/14/1/321
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