As part of the European Optical Society Annual Meeting (EOSAM) 2016 we organize a Summer School on Metrology for Thin Film Materials, which will take place in Berlin-Adlershof, Germany, September 26th, 2016.


  • Dr. Poul-Erik Hansen (DFM), Inverse problems and material properties
  • Dr. Peter de Groot (Zygo), Interference microscopy and materials characterization
  • Dr. Andreas Hertwig (BAM), Analytical techniques in the UV-VIS-IR-X ray spectral range
  • Prof. Paul Urbach (TUDelft), Current research on superresolution microscopy


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Adlershof con. vent.

Exhibition Centre
Rudower Chaussee 17
12489 Berlin-Adlershof

to reach the venue by public transport follow this link

Hotels nearby