EURAMET: European Association of National Metrology Institutes

Traceable characterisation of thin-film materials for energy applications

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Summerschool on the metrology for thin film characterization
Workshop on advanced optical measurements

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ALTECH 2017 - Analytical techniques for precise characterization of nano materials

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Registration deadline January 10, 2016

registration is closed

The research leading to these results has received funding from the European Union on the basis of Decision No 912/2009/EC.
Last updated: 2016-01-12