CONTROL 2024 Trade Fair - April 25, 2024

PTB will present guidelines and a measurement standard for optical metrology based on findings from the TracOptic project on April 25, 9:40-10:20, at the CONTROL 2024 international trade fair for quality assurance in Stuttgart. Visit this link for more information.

Nanoscale 2023 - Stakeholder Workshop, October 11, 2023

The TracOptic project hosted a stakeholder workshop at the international conference Nanoscale 2023 on October 11, 2023. This hybrid meeting was held at VTT in Finland and online. During the workshop progress on the four technical workpackages was presented. See agenda and presentations for more details.

Tutorial on Traceability in Coordinate Metrology

A tutorial on traceability in measurements with coordinate measurement machines (CMM) was presented by INRIM at the CMM Club on December 1, 2022. CMMs are versatile and suitable for virtually any geometry; however, it is difficult to ensure the traceability of measurements. The tutorial framed the problem, clarified the relationship between traceability and UNI EN ISO 10360 parameters, and illustrated the method adopted at INRIM. It was aimed primarily at CMM operators with direct experience, but also open to all interested in the subject.

Workshop on Ultra-high precision metrology for form and texture

A workshop on Ultra-high pecision metrology for form and texture was hosted by LNE and ENS-PS in November 2022.

Seminar: Advanced Focus Variation and Vertical Focus Probing for Coordinate Metrology

The project hosted an online seminar on Advanced Focus Variation and Vertical Focus Probing for Coordinate Metrology on July 17, 2022. The lecture was given by Franz Helmli of Bruker Alicona.

Workshop on 3D micro- and nano-structures: fabrication and measurement

A workshop on 3D micro- and nano-structures: fabrication and measurement was hosted by INRIM on June 14, 2022. The workshop was focused on the fundamental manufacturing processes used for the realization of samples and devices for metrology applications. The lectures included basics of micro- & nanolithography and etching methods. As part of the workshop, a visit to the fabrication and characterization laboratories was offered.

Traceable industrial 3D roughness and dimensional measurement using optical 3D microscopy and optical distance sensors

Press release, November 2021.