The SPEA TestBed
SPEA manufactures Automated Test Equipment (ATE) for testing electronics boards and components, included MEMS. SPEA aims at delivering best in class systems, satisfying the increasing market needs for faster, more accurate and more reliable test of electronic systems.
SPEA manufactures Automated Test Equipment (ATE) for testing electronics boards and components, included MEMS. SPEA aims at delivering best in class systems, satisfying the increasing market needs for faster, more accurate and more reliable test of electronic systems. The SPEA testbed is developed for validating an automated equipment for traceable in-situ calibration of MEMS temperature sensors, by using an optimised network of reference sensors in an automated test environment together with the expertize of INRIM. The SPEA Automatic Test Equipment for MEMS temperature sensor testing uses a network of reference temperature sensors, where the optimal implementation and usage of this sensor network determines the efficiency and reliability of the ATE results.
The MEMS under test are hosted in a fixture, named chuck, that besides hosting the MEMS, is specifically designed for being conditioned, thus allowing to test the devices under different environmental conditions.
R&D activities are initially oriented to identify a reference fixture and a related metrological approach for developing, prototyping and optimizing the calibration of the chuck, which is essential to perform more accurate MEMS-testing.
The next step will be the implementation of an improved reference sensor network in the actual MEMS temperature calibration testbed. In fact, the aim of the SPEA testbed is i) to demonstrate in-situ calibration and measurement traceability provision to the ATE systems and ii) and to demonstrate the effectiveness of the improved ATE system in performing traceable dynamic temperature calibrations of MEMS sensors.
MEMS sensors tested by the SPEA testbed and INRIM will be delivered within the Met4FoF Project to equip other project testbeds.
