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20th International Metrology Congress

The 20th iteration of the International Metrology Congress (CIM) will be organised as a hybrid event. It covers

  • Controlled Measurements (uncertainties, traceability, cost optimisation, certification, standardisation, conformity and risks ... for measurement, analysis and testing processes)
  • Optimised Measurements (techniques and best practices for mass, force, flow, pressure, dimension, electricity, time-frequency, temperature, hygrometry, optics and photonics, ionising radiation, chemical measures, biological measures)
  • Advanced Measurements (new technologies, smart sensors, IIOT data qualification, analysis and security, quantum technology, AI, blockchain, jobs evolution, recruitment)

With applications to all sectors: mechanics, chemistry, pharmaceuticals, health, agro-food, environment, pollution, energy.

Roundtables will be organised on

  • Metrology in the digital age
  • The role of Metrology and Quality infrastructures in the transition to Industry 4.0
  • Shopfloor measurement challenges
  • The future of diagnostics: a smart approach to health measurements
  • Industry emissions: metrology support to achieve the new requirements
  • New skills for the future metrologists