20th International Metrology Congress
The 20th iteration of the International Metrology Congress (CIM) will be organised as a hybrid event. It covers
- Controlled Measurements (uncertainties, traceability, cost optimisation, certification, standardisation, conformity and risks ... for measurement, analysis and testing processes)
- Optimised Measurements (techniques and best practices for mass, force, flow, pressure, dimension, electricity, time-frequency, temperature, hygrometry, optics and photonics, ionising radiation, chemical measures, biological measures)
- Advanced Measurements (new technologies, smart sensors, IIOT data qualification, analysis and security, quantum technology, AI, blockchain, jobs evolution, recruitment)
With applications to all sectors: mechanics, chemistry, pharmaceuticals, health, agro-food, environment, pollution, energy.
Roundtables will be organised on
- Metrology in the digital age
- The role of Metrology and Quality infrastructures in the transition to Industry 4.0
- Shopfloor measurement challenges
- The future of diagnostics: a smart approach to health measurements
- Industry emissions: metrology support to achieve the new requirements
- New skills for the future metrologists
Links:
cim2021.com/home.html