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Towards a metrological characterization of semiconductor quantum dots for quantum radiometry in the near infrared

19.09.2019

The range of possible implementations of single-photon sources in quantum information processing is rapidly growing. In order to achieve high accuracy and metrological traceability, we need reliable methods for their absolute characterization. Furthermore, single-photon emitters could be implemented as a standard source for the detection efficiency calibration of single-photon detectors. The precise measurement of small photon fluxes requires sources with high efficiency, narrow bandwidth and high single-photon purity. A promising candidate, which meets all these criteria, is an InGaAs quantum dot embedded in a deterministic photonic structure. We present measurements of the photon flux, the emission characteristics and the second-order correlation function of the InGaAs/GaAs single-photon source. The spectral filtering of the emission is realized by two bandpass filters, each having a full width at half maximum of 0.5 nm and a transmission of about 90 %. In contrast to the standard filtering method with a monochromator, our method reduces the photon losses, thus resulting in high count rates combined with high single-photon purity.

Georgieva, Hristina; 4.5, Angewandte Radiometrie, PTB-Braunschweig
López Ordonez, Marco Antonio; 4.5, Angewandte Radiometrie, PTB-Braunschweig
Rodiek, Beatrice; 4.5, Angewandte Radiometrie, PTB-Braunschweig
Hofer, Helmuth; 4.5, Angewandte Radiometrie, PTB-Braunschweig
Christinck, Justus; 4.5, Angewandte Radiometrie, PTB-Braunschweig
Schnauber, Peter; Technische Universität Berlin, Institut für Festkörperphysik, Berlin, GERMANY
Heindel, Tobias; Technische Universität Berlin, Institut für Festkörperphysik, Berlin, GERMANY
Rodt, Sven; Technische Universität Berlin, Institut für Festkörperphysik, Berlin, GERMANY
Reitzenstein, Stephan; Technische Universität Berlin, Institut für Festkörperphysik, Berlin, GERMANY
Kück, Stefan; 4, Optik, PTB-Braunschwei