
296. PTB-SEMINAR
9th International Workshop on the Analysis of Dynamic Measurements
Programme
To download the final programme, click here.
Registration
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Scope
The workshop will bring together theoretical and practical expertise in the field of dynamic measurements. The main intention is to leverage the common mathematical and statistical theory in different metrological application areas, which is possible only in such an interdisciplinary forum.
Application areas include
- Analysis for calibration and measurement of mechanical and electrical quantities,
- Analysis of measurements of temperature and radiation,
- Quantitative digital imaging and the corresponding evaluation of uncertainties,
- Analysis of measurement of light and color.
The mathematical and statistical scope of this workshop includes
- Mathematical and statistical modelling of dynamic systems,
- Regularized input estimation,
- Signal processing theory in metrology,
- Uncertainty quantification for dynamic measurements.
Invited Speakers
- Prof. Dr. Andreas Schütze
"Dynamic operation of sensors and sensing of dynamic processes: similarities, differences and challenges"
- Prof. Dr. ir. Johan Schoukens
"Nonlinear dynamic systems - identification, quantification and modeling of nonlinearities"
Organizers
Sascha Eichstädt (PTB, Germany), Trevor Esward (NPL, UK) & Nicolas Fischer (LNE, France)
Sponsor
Hottinger Baldwin Messtechnik GmbH
Official partner of EMRP IND09 "Traceably dynamic measurement of mechanical quantities" (2011-2014)
Further Information
This workshop series is coordinated by the EURAMET TC-1078, a joint project of LNE, NPL and PTB.
For more information about the field of dynamic measurements in metrology go to
- PTB website on dynamic measurements
Project website of EMRP IND09 project "Traceable dynamic measurement of mechanical quantities"
Website of MATHMET - The European Centre for Mathematics and Statistics in Metrology
The latest workshops in this series
The Workshop will take place directly after MATHMET 2016 - International Workshop on Mathematics and Statistics for Metrology.