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On-Wafer-Mikrowellenmesstechnik

Veröffentlichungen vor 2020

 

R. G. Clarke, X. Shang, N. M. Ridler, R. Lozar, T. Probst and U. Arz:
An interlaboratory study of the reproducibility of on-wafer S-parameter measurements from 140 GHz to 220 GHz.
2020 94th ARFTG Microwave Measurement Symposium (ARFTG), San Antonio, TX, USA, 2020, pp. 1-4, doi: 10.1109/ARFTG47584.2020.9071783.

U. Arz:
Traceable On-Wafer Measurements at mm-Wave Frequencies.
NIST-ARFTG Short Course on Microwave Measurements, San Antonio (TX), USA, Jan. 26–27, 2020.

G. N. Phung and U. Arz:
Parasitic Probe Effects in Measurements of Coplanar Waveguides with Narrow Ground Width.
2020 IEEE 24th Workshop on Signal and Power Integrity (SPI), Cologne, Germany, 2020, pp. 1-4, doi: 10.1109/SPI48784.2020.9218166.

G.N. Phung, U. Arz:
Einfluss parasitärer Effekte bei On-Wafer-Messungen im Millimeter- und Submillimeterwellenbereich.
316th PTB Seminar, Braunschweig, Germany, Sep. 04, 2020.

R. Lozar, M. Ohlrogge, R. Weber, N. M. Ridler, X. Shang, T. Probst and U. Arz:
A Comparative Study of On-Wafer and Waveguide Module S-Parameter Measurements at D-Band Frequencies.
IEEE Transactions on Microwave Theory and Techniques, vol. 67, no. 8, pp. 3475-3484, Aug. 2019, doi: 10.1109/TMTT.2019.2919538.

U. Arz, K. Kuhlmann, T. Dziomba, G. Hechtfischer, G. N. Phung, F.J. Schmückle and W. Heinrich:
Traceable Coplanar Waveguide Calibrations on Fused Silica Substrates up to 110 GHz.
IEEE Transactions on Microwave Theory and Techniques, vol. 67, no. 6, pp. 2423-2432, June 2019, doi: 10.1109/TMTT.2019.2908857.

G.N. Phung, F.J. Schmückle, R. Doerner, B. Kähne, T. Fritzsch, U. Arz, and W. Heinrich:
Influence of Microwave Probes on Calibrated On-Wafer Measurements.
IEEE Transactions on Microwave Theory and Techniques, vol. 67, no. 5, pp. 1892-1900, May 2019, doi: 10.1109/TMTT.2019.2903400.

G. Gold, K. Lomakin, K. Helmreich,and U. Arz:
High-Frequency Modeling of Coplanar Waveguides Including Surface Roughness.
Advances in Radio Science. 17, pp. 51-57.

U. Arz:
Rückführung planarer Streuparametermessungen auf industriellen Substraten.
314th PTB Seminar, Braunschweig, Germany, May 15, 2019.

U. Arz:
Transferring the Accuracy of Multiline TRL to Industrial Calibrations.
COMPASS FormFactor Users’ Group Conference, Munich, Germany, Nov. 14, 2019.

U. Arz and A. Savin:
On-Wafer Residual Error Correction Through Adaptive Filtering of Verification Line Measurements.
2018 International Workshop on Computing, Electromagnetics, and Machine Intelligence (CEMi), Stellenbosch, 2018, pp. 79-80, doi: 10.1109/CEMI.2018.8610566.

T. Probst, S. Zinal, R. Doerner and U. Arz:
On the Importance of Calibration Standards Definitions for On-Wafer Measurements up to 110 GHz.
2018 91st ARFTG Microwave Measurement Conference (ARFTG), Philadelphia, PA, 2018, pp. 1-4, doi: 10.1109/ARFTG.2018.8423829.

G. N. Phung, F. J. Schmückle, R. Doerner, W. Heinrich, T. Probst and U. Arz:
Impact of Substrate Modes on mTRL-Calibrated CPW Measurements in G Band.
2018 48th European Microwave Conference (EuMC), Madrid, 2018, pp. 194-197, doi: 10.23919/EuMC.2018.8541813

G. N. Phung, F. J. Schmückle, R. Doerner, W. Heinrich, T. Probst and U. Arz:
Effects Degrading Accuracy of CPW mTRL Calibration at W Band.
2018 IEEE/MTT-S International Microwave Symposium - IMS, Philadelphia, PA, 2018, pp. 1296-1299, doi: 10.1109/MWSYM.2018.8439837.

U. Arz:
Rückführung von planaren Streuparametermessungen in Membran-Technologie für Frequenzen bis 110 GHz.
311th PTB Seminar, Braunschweig, Germany, May 16, 2018.

K. Kuhlmann, U. Arz:
EURAMET PlanarCal Project.
Asia-Pacific Microwave Conference 2018, Workshop WS-J: Trends of State-of-the-Art Measurement Technology, Nov. 6, 2018.

M. Spirito, U. Arz, G.N. Phung, F.J. Schmückle, W. Heinrich, R. Lozar:
Guidelines for the design of calibration substrates, including the suppression of parasitic modes for frequencies up to and including 325 GHz.
EMPIR 14IND02 – PlanarCal, 2018. Physikalisch-Technische Bundesanstalt (PTB). DOI: doi.org/10.7795/530.20190424A

U. Arz, T. Probst, K. Kuhlmann, N. Ridler, X. Shang, F. Mubarak, J. Hoffmann, M. Wollensack, M. Zeier, G.N. Phung, W. Heinrich, Wolfgang, K. Lomakin, G. Gold, K. Helmreich, R. Lozar, G. Dambrine, K. Haddadi, M. Spirito, R. Clarke:
Best Practice Guide for Planar S-Parameter Measurements using Vector Network Analysers.
EMPIR — 14IND02 PlanarCal, 2018. Physikalisch-Technische Bundesanstalt (PTB). DOI: doi.org/10.7795/530.20190424B

T. Probst, R. Doerner, M. Ohlrogge, R. Lozar and U. Arz:
110 GHz on-wafer measurement comparison on alumina substrate.
2017 90th ARFTG Microwave Measurement Symposium (ARFTG), Boulder, CO, 2017, pp. 1-4, doi: 10.1109/ARFTG.2017.8255867.

U. Arz, S. Zinal, T. Probst, G. Hechtfischer, F. Schmückle and W. Heinrich:
Establishing traceability for on-wafer S-parameter measurements of membrane technology devices up to 110 GHz.
2017 90th ARFTG Microwave Measurement Symposium (ARFTG), Boulder, CO, 2017, pp. 1-4, doi: 10.1109/ARFTG.2017.8255874. (Best Paper Award).

F. J. Schmückle, T. Probst, U. Arz, G. N. Phung, R. Doerner and W. Heinrich:
Mutual interference in calibration line configurations.
2017 89th ARFTG Microwave Measurement Conference (ARFTG), Honololu, HI, 2017, pp. 1-4, doi: 10.1109/ARFTG.2017.8000823.

U. Arz:
PlanarCal - A European project on planar S-parameter measurements.
IMS2017 Workshop on New Developments in Microwave Measurements for Planar circuits and Components, Honolulu (HI), USA, Jun. 5, 2017.

U. Arz, D. F. Williams:
Suppression of Parasitic Mode Effects in On-Wafer Measurements via Crosstalk Correction.
EuMC2017 Workshop on Modelling, Identification and Suppression of Parasitic Modes in On-Wafer Measurements, Nuremberg, Germany, Oct. 8, 2017.

M. Bieler and U. Arz:
Comparison between time- and frequency-domain high-frequency device characterizations.
2016 Conference on Precision Electromagnetic Measurements (CPEM 2016), Ottawa, ON, 2016, pp. 1-2, doi: 10.1109/CPEM.2016.7540727.

U. Arz:
Investigating correlations in frequency-domain S-parameter measurements.
2016 87th ARFTG Microwave Measurement Conference (ARFTG), San Francisco, CA, 2016, pp. 1-4, doi: 10.1109/ARFTG.2016.7501951.

M. Bieler and U. Arz:
Characterization of high-frequency interconnects: Comparison between time- and frequency-domain methods.
2016 IEEE 20th Workshop on Signal and Power Integrity (SPI), Turin, 2016, pp. 1-4, doi: 10.1109/SaPIW.2016.7496271.

U. Arz:
Microwave Measurements for Planar Circuits and Components: State of the Art and Future Directions.
Delft University of Technology Seminar, Delft, The Netherlands, Jun. 23, 2016.

D. F. Williams, J. Jargon, U. Arz and P. Hale:
Rectangular-waveguide impedance.
2015 85th Microwave Measurement Conference (ARFTG), Phoenix, AZ, 2015, pp. 1-5, doi: 10.1109/ARFTG.2015.7162902.

U. Arz:
Vektorielle Netzwerkanalyse in planaren Schaltungen: Stand der Forschung und zukünftige Herausforderungen.
291. PTB Seminar, Braunschweig, Germany, Apr. 29, 2015.

D. F. Williams, F.J. Schmückle, R. Doerner, G.N. Phung, U. Arz, W. Heinrich:
Crosstalk Corrections for Coplanar-Waveguide Scattering Parameter Calibrations.
IEEE Transactions on Microwave Theory and Techniques, vol. 62, no. 8, pp. 1748–1761, Aug. 2014.

S. Zinal, U. Arz:
An Extended Mode-Matching Model for Improved Relative Permittivity Measurements Using a Split-Cylinder Resonator.
Advances in Radio Science, vol. 12, 2014.

U. Arz:
Loss Tangent Extraction Based on Equivalent Conductivity Derived from CPW Measurements.
18th IEEE Workshop on Signal and Power Integrity, May 11-14, 2014.

U. Arz:
Microwave Substrate Loss Tangent Extraction from Coplanar Waveguide Measurements up to 125 GHz.
83rd ARFTG Conference Digest, pp. 137–139, Jun. 6, 2014.

A. Savin, V. Guba, A. Rumiantsev, B. Maxson, D. Schubert, U. Arz:
Adaptive Estimation of Complex Calibration Residual Errors of Wafer-Level S-Parameters Measurement System.
84th ARFTG Conference Digest, pp. 48–51, Dec 4, 2014.

U. Arz:
Breitbandige Extraktion des Verlustfaktors verlustarmer Mikrowellensubstrate aus On-Wafer-Messungen an koplanaren Wellenleitern.
278. PTB Seminar, Braunschweig, Germany, May 7, 2014.

U. Arz:
Millimeter-Wave Material Characterization using On-Wafer Techniques.
Asia-Pacific Microwave Conference 2014, Nov. 4, 2014.

A. A. Savin, V. G. Guba, A. Rumiantsev, B. D. Maxon, D. Schubert, U. Arz:
Adaptive estimation of complex calibration residual errors of wafer-level S-parameters measurement system.
84th ARFTG Microwave Measurement Conference Digest (2014), Page 48-51, ISBN 978-1-4799-7084-1

 

U. Arz, D.F. Williams:
Uncertainties in complex permittivity extraction from coplanar waveguide scattering-parameter data.
2013 81st ARFTG Microwave Measurement Conference (ARFTG) (Jun. 7th, 2013), 6 S., IEEE. ISBN 978-1-4673-4983-3 ; ISBN 978-1-4673-4981-9

U. Arz:
CPW-Based Complex Permittivity Extraction and Associated Uncertainties.
The European Electromagnetic Materials Measurements and Applications Club, 2nd European Meeting, Ljubljana, Jun. 13, 2013.

 

U. Arz, M. Rohland, S. Büttgenbach:
Improving the performance of 110 GHz membrane-based interconnects on silicon: Modeling, measurements, and uncertainty analysis.
IEEE Transactions on Components, Packaging and Manufacturing Technology, 3 (2013), 11, 1938-1945; IEEE. ISSN 2156-3950

 

J. Jargon, U. Arz, D.F. Williams:
Characterizing WR-8 waveguide-to-CPW probes using two methods implemented within the NIST uncertainty framework.
Advances in wireless communication: test and measurements : 80th ARFTG Microwave Measurement Conference (2012), 1-5, IEEE. ISBN 978-1-4673-4818-8 ; ISBN 978-1-4673-4820-1

 

M. Rohland, U. Arz, K. Kuhlmann, S. Büttgenbach:
Broadband transitions for membrane-based coplanar waveguides on highly-conductive silicon substrates.
Advances in Radio Science, 10 (2012), 13-28, Copernicus Publications. ISSN 1684-9973

 

K. Kuhlmann, U. Arz:
Uncertainties in split-cylinder resonator measurements.
Non-linear measurement systems : 79th ARFTG Microwave Measurement Conference (2012), 121-124; IEEE. ISBN 978-1-4673-1230-1 ; ISBN 978-1-4673-1231-8

 

U. Arz:
On-Wafer-Messverfahren für dielektrische Substrateigenschaften bis 110 GHz.
Aktuelle Fortschritte von Kalibrierverfahren im Nieder- und Hochfrequenzbereich 2012 : Vorträge des 267. PTB-Seminars am 9. Mai 2012;
(PTB-Bericht PTB-E-101) (2012), Wirtschaftsverl. NW. ISBN 978-3-86918-272-9 ; ISSN 0341-6674

U. Arz:
Millimeter-Wave Measurements: On-Wafer Techniques.
IMS Workshop on Advanced Dielectric Measurement Techniques, Montreal, Canada, Jun. 18, 2012

 

U. Arz, M. Rohland, K. Kuhlmann, S. Büttgenbach:
Broadband performance of 110 GHz interconnects built in HRSi-based membrane technology.
SPI 2012: 16th IEEE Workshop on Signal and Power Integrity : proceedings (2012), [CD-ROM], 3-6; IEEE. ISBN 978-1-467-31502-9

 

U. Arz, M. Rohland, K. Kuhlmann, S. Büttgenbach:
Broadband 110 GHz On-Wafer Interconnects Built in CMOS-Compatible Membrane Technology.
IEEE Asia Pacific Microwave Conference 2011, Proc. pp. 1110-1113, Dec. 5-8, 2011.

 

U. Arz, M. Rohland, K. Kuhlmann, S. Büttgenbach:
Optimized Coplanar Waveguides in Membrane Technology for Wideband On-Wafer Calibrations.
20th IEEE International Conference on Electrical Performance of Electronic Packaging and Systems EPEPS 2011, Proc. pp. 77-80, Oct. 23-26, 2011.

 

M. Rohland, U. Arz, K. Kuhlmann, S. Büttgenbach:
Breitbandige On-Wafer-Kalibriernormale in Membrantechnologie.
MikroSystemTechnik Kongress 2011: Proceedings (2011), 753-756, Berlin [u.a.] : VDE-Verl.. ISBN 978-3-8007-3367-5.

 

F.J. Schmückle, R. Doerner, G.N. Phung, W. Heinrich, D.F. Williams, U. Arz:
Radiation, Multimode Propagation, and Substrate Modes in W-Band CPW Calibrations.
IEEE European Microwave Conference EuMC 2011, Proc. pp. 297-300, Oct 9-14, 2011. (EuMC Microwave Prize 2011).

 

M. Rohland, U. Arz, K. Kuhlmann, S. Büttgenbach:
Realisierung einer breitbandigen Anpassung für Membran-CPWs auf Silizium.
Kleinheubacher Tagung 2011, Sept. 26 - 28, 2011.

 

U. Arz, M. Janezic, W. Heinrich:
Wideband Relative Permittivity Extraction Based on CPW Phase Constant Measurements.
77th ARFTG Conference Digest, pp. 37-39, June 10, 2011. IEEE. ISBN 978-1-61284-960-7

 

K. Kuhlmann, U. Arz:
Comparison of different methods for calculating uncertainties in the electrical properties of planar waveguides.
77th ARFTG Conference Digest, pp. 94-98, June 10, 2011, IEEE. ISBN 978-1-61284-960-7.

 

U. Arz:
On-Wafer Interconnect Measurements on Silicon.
2011 IEEE MTT-S International Microwave Symposium Workshop WMD: Laboratory Class: Wafer-Level S-Parameter Calibration Techniques (2011), 26 S. IEEE.

 

U. Arz, K. Kuhlmann, M. Rohland, S. Büttgenbach:
Wideband Electromagnetic Modeling of Coplanar Waveguides Fabricated in Membrane Technology.
15th IEEE Workshop on Signal Propagation on Interconnects, Proc. pp. 129-130, May 8-11, 2011.

 

M. Rohland, U. Arz, and S. Büttgenbach:
Benefits of on-wafer calibration standards fabricated in membrane technology.
Kleinheubacher Berichte 2010 - Advances in Radio Science, vol. 9, 2011.

 

U. Arz:
Uncertainties in On-Wafer S-Parameter Measurements.
NIST/ARFTG Short Course on Microwave Measurements, Clearwater Beach (FL), USA, Nov. 30, 2010.

 

U. Arz, M. Rohland, S. Büttgenbach:
Improving On-Wafer Measurements with Membrane-Technology-Based Calibration Standards.
76th ARFTG Conference Digest, pp. 44-50, Dec 2, 2010.

 

M. Rohland, U. Arz, S. Büttgenbach:
Interconnects in Membrantechnologie - Vorteile und Perspektiven.
Kleinheubacher Tagung 2010, Oct. 4 - 6, 2010.

 

U. Arz, K. Kuhlmann:
Uncertainties in Coplanar Waveguide and Microstrip Line Standards for On-Wafer Thru-Reflect-Line Calibrations.
75th ARFTG Conference Digest, pp. 138-142, May 28, 2010.

K. Kuhlmann, U. Arz:
Uncertainties in Coplanar Waveguide and Microstrip Line Standards for On-Wafer Thru-Reflect-Line Calibrations.
33rd ANAMET Meeting, Fleet, Hampshire, Mai 11, 2010.

 

U. Arz:
Uncertainties in On-Wafer S-Parameter Measurements.
NIST/ARFTG Short Course on Microwave Measurements, Broomfield (CO), USA, Dec. 1-2, 2009.

 

A. Rumiantsev, P.L. Corson, S.L. Sweeney, and U. Arz:
Applying the Calibration Comparison Technique for Verification of Transmission Line Standards on Silicon up to 110 GHz.
Practical applications of nonlinear measurements : Digest 73rd ARFTG Microwave Measurement Conference, Boston, June 12, (2009): [CD-ROM], S. 67 - 72, ISBN 978-1-4244-3443-5.

 

W. Wiatr, U. Arz:
Optimization of Line Lengths for Broadband Multiline TRL Calibrations.
Agilent Technologies European Metrology Workshop, Boras, Sweden, May 13-15, 2009.

 

U. Arz, J. Leinhos, M.D. Janezic:
Broadband Dielectric Material Characterization: A Comparison of On-Wafer and Split-Cylinder Measurements.
IEEE European Microwave Conference EuMC 2008, Proc. pp. 913–916, October 27-31, 2008.

 

U. Arz, J. Leinhos and D. Janezic:
Effect of material properties on broadband electrical behavior of coplanar waveguides.
CPEM'2008 Digest, 2008 Conf. on Precision Electromagnetic Measurements, Broomfield (CO), S. 470 - 471, ISBN 978-1-424-42399-6 (print) ; ISBN 978-1-424-42400-9 (CD-ROM)

 

J. Leinhos and U.Arz:
Monte-Carlo Analysis of Measurement Uncertainties for On-Wafer Thru-Reflect-Line Calibrations.
Microwave Symposium Digest, 2008 IEEE MTT-S International

 

U. Arz, J. Leinhos:
Broadband Permittivity Extraction from On-Wafer Scattering-Parameter Measurements.
12th IEEE Workshop on Signal Propagation on Interconnects, May 12-15, 2008.

 

J. Leinhos, U. Arz:
Establishing Uncertainties for On-Wafer S-Parameter Measurements.
IEEE German Microwave Conference GeMiC 2008, Proc. pp. 439–431, March 10-12, 2008.

 

J. Leinhos, U. Arz:
Monte Carlo-Analysis of theWideband Electrical Properties of Coplanar Waveguides.
Kleinheubacher Tagung 2007, Sept. 24 - 27, 2007.

 

J. Leinhos and U. Arz:
Effect of uncertainties in the cross-sectional parameters on the wideband electrical properties of coplanar waveguides.
IEEE Workshop on Signal Propagation on Interconnects (SPI 2007), Genf, 13-16 May 2007, S. 35-38. ISBN: 978-1-4244-1223-5

 

D.F. Williams, C.M.Wang, U. Arz,:
In-Phase/Quadrature Covariance Matrix Representation of the Uncertainty of Vectors and Complex Numbers.
68th ARFTG Conference Digest, Nov. 28 - Dec. 1, 2006

 

J. Leinhos, U. Arz, I. Rolfes, H. Eul:
Practical Aspects of Implementing the TRL Calibration.
Kleinheubacher Tagung 2006, Sept. 25 - 29, 2006

 

U. Arz and D. Schubert:
Coplanar Microwave Probe Characterization: Caveats and Pitfalls.
Digest of 67th ARFTG Conference, San Francisco, 16. Juni 2006, S. 214-218. Quelle: 2006 IEEE MTT-S International Microwave Symposium Digest CD, ISBN: 0-7803-9542-5

 

U. Arz, J. Leinhos and D. Schubert:
Uncertainties in Coplanar Waveguide Capacitance Measurements.
Proceedings of 10th IEEE Workshop on Signal Propagation on Interconnects, Berlin, 10.-12. Mai 2006, S. 165-167, ISBN 1-4244-0454-1

 

J. Leinhos, U. Arz, D. Schubert, H. Eul:
On-Wafer-Meßverfahren zur Bestimmung des Kapazitätsbelages von Koplanarleitungen auf verlustarmen Substraten.
Kleinheubacher Tagung 2005, Sept. 26 - 30, 2005

 

L.J. Fernandez, U. Arz, D. Schubert, E. Berenschot, R. Wiegerink and J. Flokstra:
A CMOS compatible process for improved RF performance on highly doped substrates.
Proceedings of 9th IEEE Workshop on Signal Propagation on Interconnects, Garmisch-Partenkirchen, 10.-13. Mai 2005, IEEE Service Center: Piscataway, NJ, 2005, S.167 – 170, ISBN 0-7803-9054-7

 

M. F. Ktata, H. Grabinski, U. Arz, H. Fischer:
Influence of the Ground Line Position on the Signal Integrity of Product-Related Bus Systems Using 110 nm CMOS Technology
IEEE Transactions on Advanced Packaging, Vol. 28, No. 2 (2005), S. 152-159, ISSN 1521-3323

 

M. F. Ktata, U. Arz, H. Grabinski, H. Fischer:
Impact of Ground Line Position on CMOS Interconnect Behavior
64th ARFTG Conference Digest, pp. 207-212, Dec. 2-3, 2004

 

P. Kabos, U. Arz, D.F. Williams:
Multiport Investigation of Coupling of High-Impedance Probes
IEEE Microwave and Wireless Components Letters, Vol. 14, No. 11 (2004), S. 510-512

 

M. F. Ktata, H. Grabinski, U. Arz, H. Fischer:
Influence of Ground Line Position on Time Domain Signals in Product Related Bus Systems
Kleinheubacher Tagung 2004, Sept. 27 - Oct. 1, 2004

 

U. Arz, P. Kabos, D. F. Williams,:
Multiport Measurement of the Invasiveness of High-Impedance Probes
Kleinheubacher Tagung 2004, Sept. 27 - Oct. 1, 2004.

 

U. Arz, B. Siebert:
The Guide to the Expression of Uncertainty in Measurement (GUM)
Conf. Digest IMS 2004 Workshop on Statistical Methods and Analysis for Microwave Measurements, Fort Worth (TX), USA, June 7, 2004

 

D. F. Williams, C. M. Wang, U. Arz, N. Ridler, M. Salter, P. Harris:
Numerical Methods Employed in StatistiCAL Orthogonal Distance Regression and NPL Generalized Distance Regression Algorithms
Conf. Digest IMS 2004 Workshop on Statistical Methods and Analysis for Microwave Measurements, Fort Worth (TX), USA, June 7, 2004

 

M. F. Ktata, H. Grabinski, U. Arz, H. Fischer:
Crosstalk in Product-Related Bus Systems Using 110 nm CMOS Technology
Proc. 8th IEEE Workshop on Signal Propagation on Interconnects, pp. 85-88, May 9-12, 2004

 

U. Arz, H. Grabinski, A. Weisshaar:
VLSI Interconnect Characterization: Fundamentals, Modeling and On-Wafer Measurements
Proc. 8th IEEE Workshop on Signal Propagation on Interconnects, Heidelberg, May 9-12, 2004

 

D. F. Williams, C. M. Wang, U. Arz
An Optimal Vector-Network-Analyzer Calibration Algorithm
IEEE Transactions on Microwave Theory and Techniques, pp. 2391-2401, vol. 51, no. 12, Dec. 2003

 

U. Arz:
Ein allgemeiner Ansatz zur Messung des Wellenwiderstands in planaren Wellenleitern.
XVII. Messtechnisches Symposium des Arbeitskreises der Hochschullehrer für Messtechnik AHMT 2003, Sept. 30 - Oct. 1, 2003.

 

D. F. Williams, J. Wang and U. Arz:
StatistiCAL Vector-Network-Analyzer Calibration Software.
61st ARFTG Conference Digest, June 13, 2003

 

D. K. Walker, R. Judish, D. F. Williams, P. Kabos and U. Arz:
4-Port Measurements with a 2-Port VNA - Part II: Four-Port Measurement Comparison.
Conf. Digest IMS 2003 Workshop on Multiport/ Multimode Measurements & Related Applications, Philadelphia (PA), USA, June 8, 2003

 

U. Arz and D. F. Williams:
4-Port Measurements with a 2-Port VNA - Part I: Complete On-Wafer Coupled-Line Characterization.
Conf. Digest IMS 2003 Workshop on Multiport/ Multimode Measurements & Related Applications, Philadelphia (PA), USA, June 8, 2003

 

D. F. Williams, J. Wang and U. Arz:
An Optimal Multiline TRL Calibration Algorithm.
IEEE MTT-S International Microwave Symposium IMS 2003 Digest, pp. 1819-1822, Philadelphia (PA), USA, June 8-13, 2003

 

U. Arz, D. F. Williams and H. Grabinski:
On-Wafer Measurement Techniques for High-Speed Interconnect Characterization.
Proc. 7th IEEE Workshop on Signal Propagation on Interconnects, Siena, Italy, May 11-14, 2003

 

U. Arz, P. Kabos and D. F. Williams:
Measuring the Invasiveness of High-Impedance Probes.
Proc. 7th IEEE Workshop on Signal Propagation on Interconnects, pp. 113-115, Siena, Italy, May 11-14, 2003

 

A. Luoh, U. Arz, H. Grabinski, D. F. Williams, D. K. Walker and A. Weisshaar:
Broadband Impedance Parameters of Asymmetric Coupled CMOS Interconnects: New Closed-Form Expressions and Comparison with Measurements.
Proc. 7th IEEE Workshop on Signal Propagation on Interconnects, pp. 7-10, Siena, Italy, May 11-14, 2003

 

D. F. Williams, B. K. Alpert, U. Arz, D. K. Walker and H. Grabinski:
Causal Characteristic Impedance of Planar Transmission Lines.
IEEE Transactions on Advanced Packaging, pp. 165-171, Vol. 26, no. 2, May 2003

 

P. Kabos, H. C. Reader, U. Arz and D. F. Williams:
Calibrated Waveform Measurements with High-Impedance Probes.
IEEE Transactions on Microwave Theory and Techniques, pp. 530-535, Vol. 51, no. 2, Feb. 2003

 

U. Arz, D. F.Williams, H. Grabinski:
A General Method for Characteristic Impedance Measurement in Planar Transmission Lines.
Kleinheubacher Tagung 2002, Sept. 30 - Oct. 2, 2002

 

U. Arz and D. F. Williams:
Applications of Calibration Comparison in On-Wafer Measurement.
Conf. Digest XXVIIth General Assembly of the International Union of Radio Science URSI '02, Aug. 17-24, 2002

 

U. Arz, D. F. Williams and H. Grabinski:
Characteristic Impedance Measurement of Planar Transmission Lines.
Conf. Digest XXVIIth General Assembly of the International Union of Radio Science URSI '02, Aug. 17-24, 2002

 

U. Arz and D. F. Williams:
Going beyond Differential Line Characterization: The General Case.
Conf. Digest IMS 2002 Workshop on Differential Device Characterization and Modeling, Seattle (WA), USA, June 3, 2002

 

U. Arz:
Breitbandige On-Wafer-Messverfahren zur Bestimmung des elektrodynamischen Verhaltens planarer Leitungssysteme in der Mikroelektronik.
Dissertation, Cuvillier Verlag, Göttingen, ISBN: 3-89873-378-5, Dec. 2001

 

U. Arz, H. C. Reader, P. Kabos and D. F. Williams:
Wideband Frequency-Domain Characterization of High-Impedance Probes.
58th ARFTG Conference Digest, Nov. 29-30, 2001

 

U. Arz:
Broadband Measurements of VLSI Interconnects.
Conf. Digest ARFTG/NIST Short Course on RF Measurements for a Wireless World, San Diego (CA), USA, Nov. 27, 2001

 

U. Arz, D. F. Williams and H. Grabinski:
Experimental Study of the Ground Plane in Asymmetric Coupled Silicon Lines.
Proc. IEEE 10th Topical Meeting on Electrical Performance of Electronic Packaging EPEP 2001, pp. 317-320, Oct. 29-31, 2001

 

U. Arz, D. F. Williams und H. Grabinski:
On-Wafer Measurement of Transmission Lines on Lossy Silicon Substrates.
Kleinheubacher Berichte, Bd. 44, Ausgabe 2001, pp. 14-21

 

D. F. Williams, U. Arz and H. Grabinski:
Characteristic-Impedance Measurement Error on Lossy Substrates.
IEEE Microwave and Wireless Components Letters, pp. 299-301, vol. 11, no. 7, July 2001

 

F. Ktata, U. Arz and H. Grabinski:
Modeling the Broadband Signal Behavior in Highly Complex MCM Packages Based on S-Parameter Measurements.
Conf. Digest 5th IEEE Workshop on Signal Propagation on Interconnects, May 13-16, 2001

 

F. Ktata, U. Arz, H. Grabinski, A. Huber, K. Thumm und T. Winkel:
Modellierung von Signal- und Versorgungsleitungen sowie breitbandige Messungen in hochkomplexen MCM-Substraten.
10th E.I.S. Workshop, Dresden, Apr. 3-5, 2001

 

D. K. Walker, D. F. Williams, A. Padilla, U. Arz and H. Grabinski:
Four-Port Microwave Measurement System Speeds On-Wafer Calibration and Test.
Microwave Journal, pp. 148-154, Vol. 44, no. 3, Mar. 2001

 

U. Arz, D. F. Williams, D. K. Walker and H. Grabinski:
Asymmetric Coupled CMOS Lines: An Experimental Study.
IEEE Transactions on Microwave Theory and Techniques, pp. 2409-2414, Vol. 48, no. 12, Dec. 2000

 

U. Arz, D. F. Williams, D. K. Walker and H. Grabinski:
High-Frequency Behavior of Coupled CMOS Interconnects Built in Different Metallization Layers.
56th ARFTG Conference Digest, pp. 32-37, Nov. 30 - Dec. 1, 2000

 

U. Arz, D. F. Williams, D. K. Walker and H. Grabinski:
Accurate Electrical Measurement of Coupled Lines on Lossy Silicon.
Proc. IEEE 9th Topical Meeting on Electrical Performance of Electronic Packaging EPEP 2000, pp. 181-184, Oct. 23-25, 2000

 

U. Arz, D. F. Williams and H. Grabinski:
Characteristic Impedance Measurement on Silicon.
In: INTERCONNECTS IN VLSI DESIGN, pp. 147-154, Kluwer Academic Publishers, ISBN: 0-7923-7997-7, Oct. 2000

 

U. Arz, D. F. Williams and H. Grabinski:
On-Wafer Measurement of Transmission Lines on Lossy Silicon Substrates,
Berichte der Kleinheubacher Tagung 2000, pp. 14–21, Bd. 44, Sept. 25-29, 2000

 

F. Ktata, U. Arz and H. Grabinski:
Broadband Modeling and Measurement of the Signal Behavior in S/390 MCM Packages.
IEEE Transactions on Advanced Packaging, pp. 375-381, Vol. 23, no. 3, Aug. 2000

 

U. Arz, D. F. Williams, D. K. Walker, J. E. Rogers, M. Rudack, D. Treytnar and H. Grabinski:
Characterization of Asymmetric Coupled CMOS Lines.
2000 IEEE MTT-S International Microwave Symposium Digest, pp. 609-612, June 11-16, 2000

 

U. Arz, D. F. Williams, D. K. Walker, J. E. Rogers, M. Rudack, D. Treytnar and H. Grabinski:
Broadband Measurement of Asymmetric Coupled Lines Built in a 0.25  µm CMOS process.
Conf. Digest 4th IEEE Workshop on Signal Propagation on Interconnects, May 17-19, 2000

 

U. Arz, H. Grabinski and D. F. Williams:
Influence of the Substrate Resistivity on the Broadband Propagation Characteristics of Silicon Transmission Lines.
54th ARFTG Conference Digest, pp. 58-63, Dec. 1-2, 1999

 

F. Ktata, U. Arz and H. Grabinski:
Electrical Characterization of S/390 MCM Packages from S-Parameter Measurements below 3 GHz.
Proc. IEEE 8th Topical Meeting on Electrical Performance of Electronic Packaging EPEP '99, pp. 75-78, Oct. 25-27, 1999

 

H. Grabinski, D. Treytnar, U. Arz, F. Ktata and P. Nordholz:
Influence of Frequency-Dependent Characteristics on Deep Submicron Crosstalk Simulations.
Proc. European Conference on Circuit Theory and Design ECCTD '99, pp. 543-546, Aug. 29 - Sept. 2, 1999

 

H. Grabinski, U. Arz and D. F. Williams:
Accurate Experimental Characterization of On-Chip Interconnects.
Proc. XXVIth General Assembly of the International Union of Radio Science URSI '99, pp. 32, Aug. 13-21, 1999

 

F. Ktata, U. Arz und H. Grabinski:
Charakterisierung des Signalverhaltens bis 3 GHz in hochkomplexen Substratträgern.
5. ITG/GMM Diskussionssitzung - ANALOG '99, Feb. 18-19, 1999

 

D. F. Williams, U. Arz and H. Grabinski:
Accurate Characteristic Impedance Measurement on Silicon.
1998 IEEE MTT-S International Microwave Symposium Digest, pp. 1917-1920, June 7-12, 1998

 

U. Arz, H. Grabinski and D. F. Williams:
Accurate Characteristic Impedance Measurement on Silicon.
Conf. Digest 2nd IEEE Workshop on Signal Propagation on Interconnects, May 13-15, 1998

 

P. Nordholz, D. Treytnar, H. Grabinski, J. Otterstedt, D. Niggemeyer, U. Arz and T. W. Williams:
Core Interconnect Testing Hazards.
Proc. Design, Automation and Test in Europe DATE '98, pp. 953-954, Feb. 23-26, 1998

 

P. Nordholz, D. Treytnar, J. Otterstedt, H. Grabinski, D. Niggemeyer, U. Arz and T. W. Williams:
Deep Submicron Interconnect Coupling with Cores.
Conf. Digest 1st IEEE International Workshop on Testing Embedded Core-based Systems TECS '97, Nov. 5-6, 1997

 

H. Grabinski, P. Nordholz, D. Niggemeyer, J. Otterstedt, D. Treytnar, U. Arz and T. W. Williams:
Deep Submicron Signal Integrity and Testing.
Conf. Digest IEEE European Test Workshop ETW '97, May 28-30, 1997

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