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On-Wafer-Mikrowellenmesstechnik

Veröffentlichungen vor 2010

 

U. Arz:
Uncertainties in On-Wafer S-Parameter Measurements.
NIST/ARFTG Short Course on Microwave Measurements, Broomfield (CO), USA, Dec. 1-2, 2009.

 

A. Rumiantsev, P.L. Corson, S.L. Sweeney, and U. Arz:
Applying the Calibration Comparison Technique for Verification of Transmission Line Standards on Silicon up to 110 GHz.
Practical applications of nonlinear measurements : Digest 73rd ARFTG Microwave Measurement Conference, Boston, June 12, (2009): [CD-ROM], S. 67 - 72, ISBN 978-1-4244-3443-5.

 

W. Wiatr, U. Arz:
Optimization of Line Lengths for Broadband Multiline TRL Calibrations.
Agilent Technologies European Metrology Workshop, Boras, Sweden, May 13-15, 2009.

 

U. Arz, J. Leinhos, M.D. Janezic:
Broadband Dielectric Material Characterization: A Comparison of On-Wafer and Split-Cylinder Measurements.
IEEE European Microwave Conference EuMC 2008, Proc. pp. 913–916, October 27-31, 2008.

 

U. Arz, J. Leinhos and D. Janezic:
Effect of material properties on broadband electrical behavior of coplanar waveguides.
CPEM'2008 Digest, 2008 Conf. on Precision Electromagnetic Measurements, Broomfield (CO), S. 470 - 471, ISBN 978-1-424-42399-6 (print) ; ISBN 978-1-424-42400-9 (CD-ROM)

 

J. Leinhos and U.Arz:
Monte-Carlo Analysis of Measurement Uncertainties for On-Wafer Thru-Reflect-Line Calibrations.
Microwave Symposium Digest, 2008 IEEE MTT-S International

 

U. Arz, J. Leinhos:
Broadband Permittivity Extraction from On-Wafer Scattering-Parameter Measurements.
12th IEEE Workshop on Signal Propagation on Interconnects, May 12-15, 2008.

 

J. Leinhos, U. Arz:
Establishing Uncertainties for On-Wafer S-Parameter Measurements.
IEEE German Microwave Conference GeMiC 2008, Proc. pp. 439–431, March 10-12, 2008.

 

J. Leinhos, U. Arz:
Monte Carlo-Analysis of theWideband Electrical Properties of Coplanar Waveguides.
Kleinheubacher Tagung 2007, Sept. 24 - 27, 2007.

 

J. Leinhos and U. Arz:
Effect of uncertainties in the cross-sectional parameters on the wideband electrical properties of coplanar waveguides.
IEEE Workshop on Signal Propagation on Interconnects (SPI 2007), Genf, 13-16 May 2007, S. 35-38. ISBN: 978-1-4244-1223-5

 

D.F. Williams, C.M.Wang, U. Arz,:
In-Phase/Quadrature Covariance Matrix Representation of the Uncertainty of Vectors and Complex Numbers.
68th ARFTG Conference Digest, Nov. 28 - Dec. 1, 2006

 

J. Leinhos, U. Arz, I. Rolfes, H. Eul:
Practical Aspects of Implementing the TRL Calibration.
Kleinheubacher Tagung 2006, Sept. 25 - 29, 2006

 

U. Arz and D. Schubert:
Coplanar Microwave Probe Characterization: Caveats and Pitfalls.
Digest of 67th ARFTG Conference, San Francisco, 16. Juni 2006, S. 214-218. Quelle: 2006 IEEE MTT-S International Microwave Symposium Digest CD, ISBN: 0-7803-9542-5

 

U. Arz, J. Leinhos and D. Schubert:
Uncertainties in Coplanar Waveguide Capacitance Measurements.
Proceedings of 10th IEEE Workshop on Signal Propagation on Interconnects, Berlin, 10.-12. Mai 2006, S. 165-167, ISBN 1-4244-0454-1

 

J. Leinhos, U. Arz, D. Schubert, H. Eul:
On-Wafer-Meßverfahren zur Bestimmung des Kapazitätsbelages von Koplanarleitungen auf verlustarmen Substraten.
Kleinheubacher Tagung 2005, Sept. 26 - 30, 2005

 

L.J. Fernandez, U. Arz, D. Schubert, E. Berenschot, R. Wiegerink and J. Flokstra:
A CMOS compatible process for improved RF performance on highly doped substrates.
Proceedings of 9th IEEE Workshop on Signal Propagation on Interconnects, Garmisch-Partenkirchen, 10.-13. Mai 2005, IEEE Service Center: Piscataway, NJ, 2005, S.167 – 170, ISBN 0-7803-9054-7

 

M. F. Ktata, H. Grabinski, U. Arz, H. Fischer:
Influence of the Ground Line Position on the Signal Integrity of Product-Related Bus Systems Using 110 nm CMOS Technology
IEEE Transactions on Advanced Packaging, Vol. 28, No. 2 (2005), S. 152-159, ISSN 1521-3323

 

M. F. Ktata, U. Arz, H. Grabinski, H. Fischer:
Impact of Ground Line Position on CMOS Interconnect Behavior
64th ARFTG Conference Digest, pp. 207-212, Dec. 2-3, 2004

 

P. Kabos, U. Arz, D.F. Williams:
Multiport Investigation of Coupling of High-Impedance Probes
IEEE Microwave and Wireless Components Letters, Vol. 14, No. 11 (2004), S. 510-512

 

M. F. Ktata, H. Grabinski, U. Arz, H. Fischer:
Influence of Ground Line Position on Time Domain Signals in Product Related Bus Systems
Kleinheubacher Tagung 2004, Sept. 27 - Oct. 1, 2004

 

U. Arz, P. Kabos, D. F. Williams,:
Multiport Measurement of the Invasiveness of High-Impedance Probes
Kleinheubacher Tagung 2004, Sept. 27 - Oct. 1, 2004.

 

U. Arz, B. Siebert:
The Guide to the Expression of Uncertainty in Measurement (GUM)
Conf. Digest IMS 2004 Workshop on Statistical Methods and Analysis for Microwave Measurements, Fort Worth (TX), USA, June 7, 2004

 

D. F. Williams, C. M. Wang, U. Arz, N. Ridler, M. Salter, P. Harris:
Numerical Methods Employed in StatistiCAL Orthogonal Distance Regression and NPL Generalized Distance Regression Algorithms
Conf. Digest IMS 2004 Workshop on Statistical Methods and Analysis for Microwave Measurements, Fort Worth (TX), USA, June 7, 2004

 

M. F. Ktata, H. Grabinski, U. Arz, H. Fischer:
Crosstalk in Product-Related Bus Systems Using 110 nm CMOS Technology
Proc. 8th IEEE Workshop on Signal Propagation on Interconnects, pp. 85-88, May 9-12, 2004

 

U. Arz, H. Grabinski, A. Weisshaar:
VLSI Interconnect Characterization: Fundamentals, Modeling and On-Wafer Measurements
Proc. 8th IEEE Workshop on Signal Propagation on Interconnects, Heidelberg, May 9-12, 2004

 

D. F. Williams, C. M. Wang, U. Arz
An Optimal Vector-Network-Analyzer Calibration Algorithm
IEEE Transactions on Microwave Theory and Techniques, pp. 2391-2401, vol. 51, no. 12, Dec. 2003

 

U. Arz:
Ein allgemeiner Ansatz zur Messung des Wellenwiderstands in planaren Wellenleitern.
XVII. Messtechnisches Symposium des Arbeitskreises der Hochschullehrer für Messtechnik AHMT 2003, Sept. 30 - Oct. 1, 2003.

 

D. F. Williams, J. Wang and U. Arz:
StatistiCAL Vector-Network-Analyzer Calibration Software.
61st ARFTG Conference Digest, June 13, 2003

 

D. K. Walker, R. Judish, D. F. Williams, P. Kabos and U. Arz:
4-Port Measurements with a 2-Port VNA - Part II: Four-Port Measurement Comparison.
Conf. Digest IMS 2003 Workshop on Multiport/ Multimode Measurements & Related Applications, Philadelphia (PA), USA, June 8, 2003

 

U. Arz and D. F. Williams:
4-Port Measurements with a 2-Port VNA - Part I: Complete On-Wafer Coupled-Line Characterization.
Conf. Digest IMS 2003 Workshop on Multiport/ Multimode Measurements & Related Applications, Philadelphia (PA), USA, June 8, 2003

 

D. F. Williams, J. Wang and U. Arz:
An Optimal Multiline TRL Calibration Algorithm.
IEEE MTT-S International Microwave Symposium IMS 2003 Digest, pp. 1819-1822, Philadelphia (PA), USA, June 8-13, 2003

 

U. Arz, D. F. Williams and H. Grabinski:
On-Wafer Measurement Techniques for High-Speed Interconnect Characterization.
Proc. 7th IEEE Workshop on Signal Propagation on Interconnects, Siena, Italy, May 11-14, 2003

 

U. Arz, P. Kabos and D. F. Williams:
Measuring the Invasiveness of High-Impedance Probes.
Proc. 7th IEEE Workshop on Signal Propagation on Interconnects, pp. 113-115, Siena, Italy, May 11-14, 2003

 

A. Luoh, U. Arz, H. Grabinski, D. F. Williams, D. K. Walker and A. Weisshaar:
Broadband Impedance Parameters of Asymmetric Coupled CMOS Interconnects: New Closed-Form Expressions and Comparison with Measurements.
Proc. 7th IEEE Workshop on Signal Propagation on Interconnects, pp. 7-10, Siena, Italy, May 11-14, 2003

 

D. F. Williams, B. K. Alpert, U. Arz, D. K. Walker and H. Grabinski:
Causal Characteristic Impedance of Planar Transmission Lines.
IEEE Transactions on Advanced Packaging, pp. 165-171, Vol. 26, no. 2, May 2003

 

P. Kabos, H. C. Reader, U. Arz and D. F. Williams:
Calibrated Waveform Measurements with High-Impedance Probes.
IEEE Transactions on Microwave Theory and Techniques, pp. 530-535, Vol. 51, no. 2, Feb. 2003

 

U. Arz, D. F.Williams, H. Grabinski:
A General Method for Characteristic Impedance Measurement in Planar Transmission Lines.
Kleinheubacher Tagung 2002, Sept. 30 - Oct. 2, 2002

 

U. Arz and D. F. Williams:
Applications of Calibration Comparison in On-Wafer Measurement.
Conf. Digest XXVIIth General Assembly of the International Union of Radio Science URSI '02, Aug. 17-24, 2002

 

U. Arz, D. F. Williams and H. Grabinski:
Characteristic Impedance Measurement of Planar Transmission Lines.
Conf. Digest XXVIIth General Assembly of the International Union of Radio Science URSI '02, Aug. 17-24, 2002

 

U. Arz and D. F. Williams:
Going beyond Differential Line Characterization: The General Case.
Conf. Digest IMS 2002 Workshop on Differential Device Characterization and Modeling, Seattle (WA), USA, June 3, 2002

 

U. Arz:
Breitbandige On-Wafer-Messverfahren zur Bestimmung des elektrodynamischen Verhaltens planarer Leitungssysteme in der Mikroelektronik.
Dissertation, Cuvillier Verlag, Göttingen, ISBN: 3-89873-378-5, Dec. 2001

 

U. Arz, H. C. Reader, P. Kabos and D. F. Williams:
Wideband Frequency-Domain Characterization of High-Impedance Probes.
58th ARFTG Conference Digest, Nov. 29-30, 2001

 

U. Arz:
Broadband Measurements of VLSI Interconnects.
Conf. Digest ARFTG/NIST Short Course on RF Measurements for a Wireless World, San Diego (CA), USA, Nov. 27, 2001

 

U. Arz, D. F. Williams and H. Grabinski:
Experimental Study of the Ground Plane in Asymmetric Coupled Silicon Lines.
Proc. IEEE 10th Topical Meeting on Electrical Performance of Electronic Packaging EPEP 2001, pp. 317-320, Oct. 29-31, 2001

 

U. Arz, D. F. Williams und H. Grabinski:
On-Wafer Measurement of Transmission Lines on Lossy Silicon Substrates.
Kleinheubacher Berichte, Bd. 44, Ausgabe 2001, pp. 14-21

 

D. F. Williams, U. Arz and H. Grabinski:
Characteristic-Impedance Measurement Error on Lossy Substrates.
IEEE Microwave and Wireless Components Letters, pp. 299-301, vol. 11, no. 7, July 2001

 

F. Ktata, U. Arz and H. Grabinski:
Modeling the Broadband Signal Behavior in Highly Complex MCM Packages Based on S-Parameter Measurements.
Conf. Digest 5th IEEE Workshop on Signal Propagation on Interconnects, May 13-16, 2001

 

F. Ktata, U. Arz, H. Grabinski, A. Huber, K. Thumm und T. Winkel:
Modellierung von Signal- und Versorgungsleitungen sowie breitbandige Messungen in hochkomplexen MCM-Substraten.
10th E.I.S. Workshop, Dresden, Apr. 3-5, 2001

 

D. K. Walker, D. F. Williams, A. Padilla, U. Arz and H. Grabinski:
Four-Port Microwave Measurement System Speeds On-Wafer Calibration and Test.
Microwave Journal, pp. 148-154, Vol. 44, no. 3, Mar. 2001

 

U. Arz, D. F. Williams, D. K. Walker and H. Grabinski:
Asymmetric Coupled CMOS Lines: An Experimental Study.
IEEE Transactions on Microwave Theory and Techniques, pp. 2409-2414, Vol. 48, no. 12, Dec. 2000

 

U. Arz, D. F. Williams, D. K. Walker and H. Grabinski:
High-Frequency Behavior of Coupled CMOS Interconnects Built in Different Metallization Layers.
56th ARFTG Conference Digest, pp. 32-37, Nov. 30 - Dec. 1, 2000

 

U. Arz, D. F. Williams, D. K. Walker and H. Grabinski:
Accurate Electrical Measurement of Coupled Lines on Lossy Silicon.
Proc. IEEE 9th Topical Meeting on Electrical Performance of Electronic Packaging EPEP 2000, pp. 181-184, Oct. 23-25, 2000

 

U. Arz, D. F. Williams and H. Grabinski:
Characteristic Impedance Measurement on Silicon.
In: INTERCONNECTS IN VLSI DESIGN, pp. 147-154, Kluwer Academic Publishers, ISBN: 0-7923-7997-7, Oct. 2000

 

U. Arz, D. F. Williams and H. Grabinski:
On-Wafer Measurement of Transmission Lines on Lossy Silicon Substrates,
Berichte der Kleinheubacher Tagung 2000, pp. 14–21, Bd. 44, Sept. 25-29, 2000

 

F. Ktata, U. Arz and H. Grabinski:
Broadband Modeling and Measurement of the Signal Behavior in S/390 MCM Packages.
IEEE Transactions on Advanced Packaging, pp. 375-381, Vol. 23, no. 3, Aug. 2000

 

U. Arz, D. F. Williams, D. K. Walker, J. E. Rogers, M. Rudack, D. Treytnar and H. Grabinski:
Characterization of Asymmetric Coupled CMOS Lines.
2000 IEEE MTT-S International Microwave Symposium Digest, pp. 609-612, June 11-16, 2000

 

U. Arz, D. F. Williams, D. K. Walker, J. E. Rogers, M. Rudack, D. Treytnar and H. Grabinski:
Broadband Measurement of Asymmetric Coupled Lines Built in a 0.25  µm CMOS process.
Conf. Digest 4th IEEE Workshop on Signal Propagation on Interconnects, May 17-19, 2000

 

U. Arz, H. Grabinski and D. F. Williams:
Influence of the Substrate Resistivity on the Broadband Propagation Characteristics of Silicon Transmission Lines.
54th ARFTG Conference Digest, pp. 58-63, Dec. 1-2, 1999

 

F. Ktata, U. Arz and H. Grabinski:
Electrical Characterization of S/390 MCM Packages from S-Parameter Measurements below 3 GHz.
Proc. IEEE 8th Topical Meeting on Electrical Performance of Electronic Packaging EPEP '99, pp. 75-78, Oct. 25-27, 1999

 

H. Grabinski, D. Treytnar, U. Arz, F. Ktata and P. Nordholz:
Influence of Frequency-Dependent Characteristics on Deep Submicron Crosstalk Simulations.
Proc. European Conference on Circuit Theory and Design ECCTD '99, pp. 543-546, Aug. 29 - Sept. 2, 1999

 

H. Grabinski, U. Arz and D. F. Williams:
Accurate Experimental Characterization of On-Chip Interconnects.
Proc. XXVIth General Assembly of the International Union of Radio Science URSI '99, pp. 32, Aug. 13-21, 1999

 

F. Ktata, U. Arz und H. Grabinski:
Charakterisierung des Signalverhaltens bis 3 GHz in hochkomplexen Substratträgern.
5. ITG/GMM Diskussionssitzung - ANALOG '99, Feb. 18-19, 1999

 

D. F. Williams, U. Arz and H. Grabinski:
Accurate Characteristic Impedance Measurement on Silicon.
1998 IEEE MTT-S International Microwave Symposium Digest, pp. 1917-1920, June 7-12, 1998

 

U. Arz, H. Grabinski and D. F. Williams:
Accurate Characteristic Impedance Measurement on Silicon.
Conf. Digest 2nd IEEE Workshop on Signal Propagation on Interconnects, May 13-15, 1998

 

P. Nordholz, D. Treytnar, H. Grabinski, J. Otterstedt, D. Niggemeyer, U. Arz and T. W. Williams:
Core Interconnect Testing Hazards.
Proc. Design, Automation and Test in Europe DATE '98, pp. 953-954, Feb. 23-26, 1998

 

P. Nordholz, D. Treytnar, J. Otterstedt, H. Grabinski, D. Niggemeyer, U. Arz and T. W. Williams:
Deep Submicron Interconnect Coupling with Cores.
Conf. Digest 1st IEEE International Workshop on Testing Embedded Core-based Systems TECS '97, Nov. 5-6, 1997

 

H. Grabinski, P. Nordholz, D. Niggemeyer, J. Otterstedt, D. Treytnar, U. Arz and T. W. Williams:
Deep Submicron Signal Integrity and Testing.
Conf. Digest IEEE European Test Workshop ETW '97, May 28-30, 1997

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