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The optics and semiconductor industry uses increasingly innovative materials and complex nanostructures, whose optical properties are difficult to measure and often not accurately known. Hence, traceable metrology and advanced mathematical methods to characterize these materials for wavelength ranges from soft-X ray to IR are needed. These developments are crucial for simulations and design of...

Datum:Do 06.10.2022 09:00 bis 17:30

WISTA Event Center | Bunsen Hall.

Rudower Chaussee 17 | 12489 Berlin-Adlershof

Vortragender:verschiedene - sh. pdf

Kolloquium der Abteilung 8

Datum:Do 06.10.2022 11:00 bis 12:00

Hörsaal im HvH IB und WebEx

Vortragender:Prof. Dr. Thomas M. Deserno