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This conference will focus on essentially any optical metrology, where modelling aspects play a crucial role and accurate modelling is a prerequisite for traceable and comparable measurements. One important topic is the development and verification of methods to describe the interaction of light with matter for quantitative characterization of micro- and nanostructures. The verification of these...

Datum:Mo 24.06.2019 bis 27.06.2019
Ort:

München, Internationales Congress Center