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The optics and semiconductor industries make increasing use of innovative materials and complex nanostructures, whose optical properties are difficult to measure and often not accurately known. The ATMOC project addresses the development of traceable metrology and advanced mathematical methods to characterize these materials for wavelength ranges from soft X-ray to IR.


Date:Tue 06.12.2022 / 14:00
to:Wed 07.12.2022 / 13:00

PTB Berlin WWL Hörsaal

Speaker:Victor Soltwisch (FB 7.1) und Sebastian Heidenreich (FB 8.4)