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The 20th iteration of the International Metrology Congress (CIM) will be organised as a hybrid event. It covers

  • Controlled Measurements (uncertainties, traceability, cost optimisation, certification, standardisation, conformity and risks ... for measurement, analysis and testing processes)
  • Optimised Measurements (techniques and best practices for mass, force, flow, pressure, dimension,...
Date:Tue 07.09.2021 / 09:00
to:Thu 09.09.2021 / 17:00

Lyon (France)