This conference will focus on essentially any optical metrology, where modelling aspects play a crucial role and accurate modelling is a prerequisite for traceable and comparable measurements. One important topic is the development and verification of methods to describe the interaction of light with matter for quantitative characterization of micro- and nanostructures. The verification of these...
Prof. Gerd Multhaup (McGill University),
Prof. Frank J Gunn-Moore (University of St. Andrews),
Prof. Albert Sickmann (Leibniz-Institut für Analytische Wissenschaften-ISAS-e.V.)