Publication single view
Article
Title: | Deep learning for tilted-wave interferometry |
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Author(s): | L. Hoffmann, I. Fortmeier and C. Elster |
Journal: | tm - Technisches Messen |
Year: | 2021 |
DOI: | 10.1515/teme-2021-0103 |
Keywords: | publiziert |
Tags: | 8.4,8.42,Form,ML |