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Mathematical Modelling and Data Analysis

Department 8.4

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Title: Development of a metrological reference system for the form measurement of aspheres and freeform surfaces based on a tilted-wave interferometer
Author(s): I. Fortmeier, M. Stavridis, M. Schulz and C. Elster
Journal: Measurement Science and Technology
Year: 2022
Volume: 33
Issue: 4
State: accepted
DOI: 10.1088/1361-6501/ac47bd
Tags: 8.4,8.42,Form

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