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Mathematical Modelling and Data Analysis

Department 8.4

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Title: Thermal expansion and compressibility of single-crystal silicon between 285 K and 320 K
Author(s): G. Bartl, C. Elster, J. Martin, R. Schödel, M. Voigt and A. Walkov
Journal: Measurement Science and Technology
Year: 2020
Volume: 31
Issue: 6
DOI: 10.1088/1361-6501/ab7359
Tags: 8.4,8.42,Unsicherheit,Regression

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