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Mathematical Modelling and Data Analysis

Department 8.4

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Title: Application of Bayesian model averaging to the determination of thermal expansion of single-crystal silicon
Author(s): J. Martin, G. Bartl and C. Elster
Journal: Measurement Science and Technology
Year: 2019
Volume: 30
Pages: 045012
DOI: 10.1088/1361-6501/ab094b
Tags: 8.4,8.42,Unsicherheit,Regression

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