Publication single view
Article
Title: | Thermal expansion and compressibility of single-crystal silicon between 285 K and 320 K |
---|---|
Author(s): | G. Bartl, C. Elster, J. Martin, R. Schödel, M. Voigt and A. Walkov |
Journal: | Measurement Science and Technology |
Year: | 2020 |
Volume: | 31 |
Issue: | 6 |
DOI: | 10.1088/1361-6501/ab7359 |
Tags: | 8.4,8.42,Unsicherheit,Regression |