Publication single view
Article
Title: | Application of Bayesian model averaging to the determination of thermal expansion of single-crystal silicon |
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Author(s): | J. Martin, G. Bartl and C. Elster |
Journal: | Measurement Science and Technology |
Year: | 2019 |
Volume: | 30 |
Pages: | 045012 |
DOI: | 10.1088/1361-6501/ab094b |
Tags: | 8.4,8.42,Unsicherheit,Regression |