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Data Analysis and Measurement Uncertainty

Working Group 8.42

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Article

Title: Optoelectronic time-domain characterization of a 100 GHz sampling oscilloscope
Author(s): H. Füser, S. Eichstädt, K. Baaske, C. Elster, K. Kuhlmann, R. Judaschke, K. Pierz and M. Bieler
Journal: Measurement Science and Technology
Year: 2012
Volume: 23
Issue: 2
Pages: 025201
IOP Publishing
DOI: 10.1088/0957-0233/23/2/025201
ISSN: 0957-0233
File URL: fileadmin/internet/fachabteilungen/abteilung_8/8.4_mathematische_modellierung/Publikationen_8.4/Fueser_Osci_preprint.pdf
Web URL: http://iopscience.iop.org/article/10.1088/0957-0233/23/2/025201
Keywords: dynamic measurement, oscilloscope, dynamic calibration, impulse response
Tags: 8.42,Dynamik
Abstract: We have performed an optoelectronic measurement of the impulse response of an ultrafast sampling oscilloscope with a nominal bandwidth of 100 GHz within a time window of approximately 100 ps. Our experimental technique also considers frequency components above the cut-off frequency of higher-order modes of the 1.0 mm coaxial line, which is shown to be important for the specification of the impulse response of ultrafast sampling oscilloscopes. Additionally, we have measured the reflection coefficient of the sampling head induced by the mismatch of the sampling circuit and the coaxial connector which is larger than 0.5 for certain frequencies. The uncertainty analysis has been done using the Monte Carlo method of Supplement 1 to the ‘Guide to the Expression of Uncertainty in Measurement’ and correlations in the estimated impulse response have been determined. Our measurements extend previous work which deals with the characterization of 70 GHz oscilloscopes and the measurement of 100 GHz oscilloscopes up to the cut-off frequency of higher-order modes.

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