Dr. Jan Wernecke was recognised for his doctorial dissertation “When Size Does Matter: Dimensional Metrology of Nanostructured Layers and Surfaces Using X-Rays” at the Technische Universität Berlin with the 2016 Ernst Eckhard Koch Prize of the Association of Friends of Helmholtz-Zentrum Berlin. His doctoral studies were carried out in the X-ray Radiometry group at the electron storage ring BESSY II in Berlin. The main task consisted of employing small-angle X-ray scattering for measuring nano-dimensional features on surfaces and thus establish standard metrological data traceable back to the international system of units SI with uncertainties in the range of a few atomic diameters
Contact:
M. Richter, 7.1, e-mail: Mathias.Richter(at)ptb.de