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343 results:
131. Determination of atomic fundamental parameters  
Date: 02.10.2018
Percental score: 17 %
Determination of atomic fundamental parameters Dr. Burkhard Beckhoff Physikalisch-Technische Bundesanstalt 7.24 Röntgenspektrometrie Abbestraße 2–12 10587 Berlin burkhard.beckhoff@ptb.de (030)  
132. Farfield Fourier Transform Infrared (FTIR)-Microspectroscopy  
Date: 02.10.2018
Percental score: 16 %
Farfield Fourier Transform Infrared (FTIR)-Microspectroscopy Dr. Burkhard Beckhoff Physikalisch-Technische Bundesanstalt 7.24 Röntgenspektrometrie Abbestraße  
133. Scattering Type Scanning Near-field Optical Microscopy and Nano-FTIR Spectroscopy  
Date: 02.10.2018
Percental score: 15 %
Scattering Type Scanning Near-field Optical Microscopy and Nano-FTIR Spectroscopy Dr. Burkhard Beckhoff Physikalisch-Technische Bundesanstalt 7.24 Röntgenspektrometrie Abbestraße  
134. THz Activities  
Date: 02.10.2018
Percental score: 18 %
THz Activities Dr. Burkhard Beckhoff Physikalisch-Technische Bundesanstalt 7.24 Röntgenspektrometrie Abbestraße 2–12 10587 Berlin burkhard.beckhoff@ptb.de (030) 3481-7170  
135. Reference-free X-Ray Fluorescence analysis (XRF)  
Date: 02.10.2018
Percental score: 16 %
Reference-free X-Ray Fluorescence analysis (XRF) Dr. Burkhard Beckhoff Physikalisch-Technische Bundesanstalt 7.24 Röntgenspektrometrie Abbestraße 2–12 10587 Berlin burkhard.beckhoff@ptb.de (030)  
136. Grazing incidence X-Ray Fluorescence (GIXRF)  
Date: 02.10.2018
Percental score: 17 %
Grazing incidence X-Ray Fluorescence (GIXRF) Dr. Burkhard Beckhoff Physikalisch-Technische Bundesanstalt 7.24 Röntgenspektrometrie Abbestraße 2–12 10587 Berlin burkhard.beckhoff@ptb.de (030)  
137. Total reflection X-Ray Fluorescence (TXRF)  
Date: 02.10.2018
Percental score: 17 %
Total reflection X-Ray Fluorescence (TXRF) Dr. Burkhard Beckhoff Physikalisch-Technische Bundesanstalt 7.24 Röntgenspektrometrie Abbestraße 2–12 10587 Berlin burkhard.beckhoff@ptb.de (030)  
138. European X-ray Spectrometry Association Prizes for PTB Scientists  
Date: 15.08.2018
Percental score: 12 %
Since 2006, the European X-Ray Spectrometry Association (EXSA) has awarded prizes for excellent work in the field of x-ray spectrometry and, since 2010, additionally for the best dissertation in  
139. Hybrid metrology technology for nanostructured surfaces  
Date: 30.07.2018
Percental score: 5 %
The significant challenges posed by the increasing complexity of nanostructured surfaces used in technological applications include the characterization of such surfaces. The importance of complex  
140. PTB Celebrating 20 years of NIMT  
Date: 07.06.2018
Percental score: 1 %
PTB Celebrating 20 years of NIMT INTERNATIONAL COOPERATION 20 Celebrating the 20th Anniversary of NIMT 20 Years of Cooperation between NIMT and PTB 1 2 20 1 2 contents สารบัญ PTB Foreword  
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