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369 results:
  • 121. QMH Abt7 KAP3 1 A20  
    Date: 11.06.2021
    Percental score: 2 %
    QMH Abt7 KAP3 1 A20 Qualitätsmanagement-Handbuch Abteilung 7 3.1 Kalibrier- und Messmöglichkeiten Calibration and measurement  
  • 122. On-Wafer Microwave measurements  
    Date: 12.05.2021
    Percental score: 3 %
    Publications before 2020   R. G. Clarke, X. Shang, N. M. Ridler, R. Lozar, T. Probst and U. Arz: An interlaboratory study of the reproducibility of on-wafer S-parameter measurements from 140  
  • 123. Measurement of HF impedance, reflection coefficient and S-parameters  
    Date: 12.05.2021
    Percental score: 4 %
    Publications before 2020   N. Shoaib, K. Kuhlmann, R. Judaschke: Investigation of Verification Artefacts in Rectangular Waveguide up to 325 GHz 1st URSI Atlantic Radio Science Conference  
  • 124. HF voltage measurement  
    Date: 12.05.2021
    Percental score: 3 %
    Publications before 2020   J. Dittmer, L. Hecht, R. Judaschke, and S. Büttgenbach: RMS voltage sensor based on a variable parallel-plate capacitor made of electroplated copper. Microsystem  
  • 125. HF power measurement  
    Date: 12.05.2021
    Percental score: 6 %
    Publications before 2020   Xiaohai Cui, Yu Song Meng, R. Judaschke, J. Rühaak, T.P. Crowley, R.A. Ginley International Comparison of WR15 (50 to 75 GHz) Power Measurements among NIST, NIM,  
  • 126. HF electromagnetic fields, EMC - Antennas - Terahertz  
    Date: 12.05.2021
    Percental score: 1 %
    Publications until 2020   J. Ornik, J. Lehr, M. Reuter, D. Jahn, F. Felipe-Mejia, J. C. Balzer, T. Kleine-Ostmann, and M. Koch Repeatability of material parameter extraction of liquids from  
  • 127. About Time  
    Date: 03.05.2021
    Percental score: 3 %
    Flyer "About Time" About Time Physikalisch-Technische Bundesanstalt National Metrology Institute About Time Realization and Dissemination of Legal Time in the Federal Republic of Germany Time  
  • 128. Der Meter  
    Date: 28.04.2021
    Percental score: 3 %
    Der Meter Der Meter Darstellung der SI-Einheit für die Länge Fachbereich „Interferometrie an Maßverkörperungen“ Übersicht ➢Einführung ➢Längenmessung mittels Interferometrie ➢Begrenzende  
  • 129. Magneto-Seebeck Microscopy  
    Date: 30.03.2021
    Percental score: 7 %
    In scanning probe microscopy (SPM) images of surfaces are created by moving a tip across the surface. Research in SPM aims to find suitable tips and physical interaction mechanisms which uncover  
  • 130. Detection of anisotropy in the optical constants of quartz crystals for soft X-rays  
    Date: 18.03.2021
    Percental score: 8 %
    Quartz is an important substrate material for semiconductor structures and is used in a wide variety of industrial fields, for example as a substrate for various mirrors, nanostructures or other  
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