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330 results:
91. Publications  
Date: 09.07.2019
Percental score: 6 %
Publications Dai, G., Hahm, K., Scholze, F. et al. 2014 Measurements of CD and sidewall profile of EUV photomask structures using CD-AFM and tilting-AFM, Meas. Sci. Tech., 25(4) Dai, G.,  
92. VirtMet Whitepaper public EN  
Date: 18.06.2019
Percental score: 2 %
VirtMet Whitepaper public EN PTB Competence Center "Metrology for Virtual Measuring Instruments" (VirtMet) In the course of digitalization, the importance of simulations and in silico experiments  
93. 2019 UNIDO OIML CS online  
Date: 12.06.2019
Percental score: 2 %
2019 UNIDO OIML CS online CERTIFICATION OF MEASURING INSTRUMENTS 1 1 ACKNOWLEDGMENTS UNIDO gratefully acknowledges the dedicated work of Mr. Paul Dixon (OIML) and Mr. Grégory Glas (BEIS-UK),  
94. Summary Evaluation PTB SEE QI  
Date: 12.06.2019
Percental score: 5 %
Summary Evaluation PTB SEE QI TECHNICAL COOPERATION EXTERNAL EVALUATION – SHORT REPORT Evaluator: Ms Suzana Lange “Promotion of regional cooperation in South East Europe in the field of quality  
95. TWI Publications  
Date: 07.06.2019
Percental score: 11 %
Selected References: [1]    I. Fortmeier,  M. Stavridis, A. Wiegmann, M. Schulz, W. Osten, C. Elster, Evaluation of absolute form measurements using a tilted-wave interferometer,  
96. Getting to PTB in Berlin Charlottenburg  
Date: 06.05.2019
Percental score: 7 %
Getting to PTB in Berlin Charlottenburg Getting to PTB in Berlin-Charlottenburg From Berlin-Tegel Airport to PTB’s Berlin Institute In Charlottenburg, PTB is not far from Berlin Zoologischer Garten  
97. E Glasschmelzen  
Date: 03.05.2019
Percental score: 4 %
E Glasschmelzen Working Group 3.32 “Properties of Liquids“ Calibration materials for viscosity measurements on glass melts PTB offers three glasses with different viscosity-temperature behaviour (VT  
98. 2.24 Non-Linear High-Frequency Metrology for Digitalization  
Date: 11.03.2019
Percental score: 94 %
2.24 Non-Linear High-Frequency Metrology for Digitalization Dr. Friederike Stein Physikalisch-Technische Bundesanstalt 2.24 Nichtlineare Hochfrequenzmesstechnik für die Digitalisierung Bundesallee  
99. 2.24 Non-Linear High-Frequency Metrology for Digitalization  
Date: 11.03.2019
Percental score: 69 %
The aim of the working group is to establish traceability for non-linear RF measurement technology and to support the accreditation of the DAkkS for derived RF measurement quantities in the form of  
100. 5.24 Electron Microscopy  
Date: 08.03.2019
Percental score: 99 %
5.24 Electron Microscopy Dr. Tobias Klein Physikalisch-Technische Bundesanstalt 5.24 Elektronenmikroskopie Bundesallee 100 38116 Braunschweig tobias.klein@ptb.de (0531) 592-5240  
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