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342 results:
71. Confirmation of the results obtained in the mass determination of the 28Si spheres AVO28-S5c and AVO28-S8c in 2013 and 2014  
Date: 24.10.2018
Percental score: 6 %
Within the scope of comparison measurements with regard to the results of the determination of the Avogadro constant and the Planck constant with the aid of the first two monocrystalline silicon  
72. Core Objective 3: holistic concepts for measuring instruments and data  
Date: 02.06.2021
Percental score: 4 %
New measurement devices often contain distributed, partially virtualised components and use services from the cloud. However, in regulated areas, the barriers in terms of approval and conformity  
73. Criteria and Procedures QS Approval June2020  
Date: 14.09.2020
Percental score: 2 %
Criteria and Procedures QS Approval June2020 Conformity Assessment Body Criteria and procedures for the approval of the quality systems of measuring instruments manufacturers according to • the  
74. Criteria and Procedures QS Approval May2020  
Date: 12.05.2020
Percental score: 2 %
Criteria and Procedures QS Approval May2020 Conformity Assessment Body Criteria and procedures for the approval of the quality systems of measuring instruments manufacturers according to • the  
75. Dates  
Date: 04.12.2018
Percental score: 10 %
12 September 2013 Informative meeting for the sound test centres members of the Verband der Materialprüfungsanstalten (VMPA) 08:00 o'clock until 18:00 o'clock, PTB Braunschweig, Auditorium Contact:  
76. Dates  
Date: 29.06.2021
Percental score: 6 %
List of current activities organized by the Division Precision Engineering or supported by members of the Division, e.g. by participation in scientific programme committees, etc.: [Translate to  
77. 2004 Bauch PTB-Mitt 114,4 DCF77  
Date: 01.03.2010
Percental score: 2 %
2004 Bauch PTB-Mitt 114,4 DCF77 PTB-Mitteilungen 114 (2004), Heft 4 Themenschwerpunkt • 345 Zeit- und Normalfrequenzverbreitung mit DCF77 Dirk Piester1, Peter Hetzel2 und Andreas  
78. Depth-Setting standards for measurement ranges from 1 µm to 5 mm  
Date: 13.02.2017
Percental score: 4 %
Depth Setting Standards for Measurement Ranges from 1 µm to 5 mm Microsystem technology makes it possible to miniaturize existing systems and to manufacture novel systems. For the dimensional  
79. Design and manufacturing of a luminaire positioning fixture  
Date: 08.01.2010
Percental score: 7 %
To accelerate and facilitate the workflow in intrinsic safety tests, a new facility was designed and manufactured in cooperation with Department "Intrinsic Safety and Safety of Systems" for the  
80. Detection of anisotropy in the optical constants of quartz crystals for soft X-rays  
Date: 18.03.2021
Percental score: 8 %
Quartz is an important substrate material for semiconductor structures and is used in a wide variety of industrial fields, for example as a substrate for various mirrors, nanostructures or other  
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