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336 results:
61. Measurement of HF impedance, reflection coefficient and S-parameters  
Date: 12.05.2021
Percental score: 4 %
Publications before 2020   N. Shoaib, K. Kuhlmann, R. Judaschke: Investigation of Verification Artefacts in Rectangular Waveguide up to 325 GHz 1st URSI Atlantic Radio Science Conference  
62. HF voltage measurement  
Date: 12.05.2021
Percental score: 3 %
Publications before 2020   J. Dittmer, L. Hecht, R. Judaschke, and S. Büttgenbach: RMS voltage sensor based on a variable parallel-plate capacitor made of electroplated copper. Microsystem  
63. HF power measurement  
Date: 12.05.2021
Percental score: 6 %
Publications before 2020   Xiaohai Cui, Yu Song Meng, R. Judaschke, J. Rühaak, T.P. Crowley, R.A. Ginley International Comparison of WR15 (50 to 75 GHz) Power Measurements among NIST, NIM,  
64. HF electromagnetic fields, EMC - Antennas - Terahertz  
Date: 12.05.2021
Percental score: 1 %
Publications until 2020   J. Ornik, J. Lehr, M. Reuter, D. Jahn, F. Felipe-Mejia, J. C. Balzer, T. Kleine-Ostmann, and M. Koch Repeatability of material parameter extraction of liquids from  
65. Metrology of Ultra-Low Magnetic Fields  
Date: 03.05.2021
Percental score: 7 %
Welcome to the Core facility ''Metrologie of Ultra-Low Magnetic Fields'' of PTB Since 1 May 2017, the Physikalisch-Technische Bundesanstalt operates a new Core Facility called ''Metrology  
66. About Time  
Date: 03.05.2021
Percental score: 3 %
Flyer "About Time" About Time Physikalisch-Technische Bundesanstalt National Metrology Institute About Time Realization and Dissemination of Legal Time in the Federal Republic of Germany Time  
67. Virtual Measurement Process VMP  
Date: 01.04.2021
Percental score: 10 %
Project duration Start: November 2019 End:  October 2022 Project description With raising demand for “virtual measurements” in measurement uncertainty estimation also the demand for  
68. Magneto-Seebeck Microscopy  
Date: 30.03.2021
Percental score: 7 %
In scanning probe microscopy (SPM) images of surfaces are created by moving a tip across the surface. Research in SPM aims to find suitable tips and physical interaction mechanisms which uncover  
69. Detection of anisotropy in the optical constants of quartz crystals for soft X-rays  
Date: 18.03.2021
Percental score: 8 %
Quartz is an important substrate material for semiconductor structures and is used in a wide variety of industrial fields, for example as a substrate for various mirrors, nanostructures or other  
70. Publications  
Date: 01.03.2021
Percental score: 19 %
Publications Dr. Shanna Schönhals Physikalisch-Technische Bundesanstalt 1.24 Informationstechnik Kraft und Drehmoment Bundesallee 100 38116 Braunschweig shanna.schoenhals@ptb.de (0531) 592-1240  
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