Logo of the Physikalisch-Technische Bundesanstalt

Search

Search result

439 results:
  • 61. X-ray absorption fine structure spectroscopy (XAFS)  
    Date: 02.10.2018
    Percental score: 16 %
    X-ray absorption fine structure spectroscopy (XAFS) Dr. Burkhard Beckhoff Physikalisch-Technische Bundesanstalt 7.24 Röntgenspektrometrie Abbestraße 2–12 10587 Berlin burkhard.beckhoff@ptb.de (030)  
  • 62. Farfield Fourier Transform Infrared (FTIR)-Microspectroscopy  
    Date: 02.10.2018
    Percental score: 16 %
    Farfield Fourier Transform Infrared (FTIR)-Microspectroscopy Dr. Burkhard Beckhoff Physikalisch-Technische Bundesanstalt 7.24 Röntgenspektrometrie Abbestraße  
  • 63. Transmissionsmodus im REM (TSEM, STEM-in-SEM)  
    Date: 25.09.2023
    Percental score: 16 %
    Transmissionsmodus im REM (TSEM, STEM-in-SEM) Dr. Tobias Klein Physikalisch-Technische Bundesanstalt 5.24 Elektronenmikroskopie Bundesallee 100 38116 Braunschweig tobias.klein@ptb.de (0531)  
  • 64. Monte Carlo methods for simulating image contrast in SEM  
    Date: 27.09.2023
    Percental score: 16 %
    Monte Carlo methods for simulating image contrast in SEM Dr. Tobias Klein Physikalisch-Technische Bundesanstalt 5.24 Elektronenmikroskopie Bundesallee  
  • 65. Modular Monte Carlo simulation program  
    Date: 25.09.2023
    Percental score: 16 %
    Modular Monte Carlo simulation program Iris Weidner Physikalisch-Technische Bundesanstalt 5.24 Elektronenmikroskopie 38116 Braunschweig iris.weidner@ptb.de (0531) 592-5201 (0531) 592-5205  
  • 66. 273rd PTB Seminar  
    Date: 25.11.2013
    Percental score: 16 %
    The 273rd PTB Seminar "VUV and EUV Metrology" was held in the Lecture Hall of the Helmholtz-Zentrum Berlin at the electron storage ring BESSY II in Berlin-Adlershof  
  • 67. High resolution wavelength-dispersive X-Ray Fluorescence Analysis (RFA)  
    Date: 02.10.2018
    Percental score: 16 %
    High resolution wavelength-dispersive X-Ray Fluorescence Analysis (RFA) Dr. Burkhard Beckhoff Physikalisch-Technische Bundesanstalt 7.24 Röntgenspektrometrie Abbestraße  
  • 68. Transmissionsmodus im REM (TSEM, STEM-in-SEM)  
    Date: 25.09.2023
    Percental score: 15 %
    Transmissionsmodus im REM (TSEM, STEM-in-SEM) Iris Weidner Physikalisch-Technische Bundesanstalt 5.24 Elektronenmikroskopie 38116 Braunschweig iris.weidner@ptb.de (0531) 592-5201 (0531) 592-5205  
  • 69. Scattering Type Scanning Near-field Optical Microscopy and Nano-FTIR Spectroscopy  
    Date: 02.10.2018
    Percental score: 15 %
    Scattering Type Scanning Near-field Optical Microscopy and Nano-FTIR Spectroscopy Dr. Burkhard Beckhoff Physikalisch-Technische Bundesanstalt 7.24 Röntgenspektrometrie Abbestraße  
  • 70. Monte Carlo methods for simulating image contrast in SEM  
    Date: 27.09.2023
    Percental score: 15 %
    Monte Carlo methods for simulating image contrast in SEM Iris Weidner Physikalisch-Technische Bundesanstalt 5.24 Elektronenmikroskopie 38116 Braunschweig iris.weidner@ptb.de (0531) 592-5201 (0531)  
###SPINNER###
Search results 61 until 70 of 439
The search query was processed in 2319 ms.

Search behavior

In the search, the following parameters can be used:

  • "": Phrase search. The words you entered must occur exactly as entered in the search results. Example: "Metrological Services"
  • -: NOT operation. A word can not appear in the search results. Example: "Metrological Services" -"Verification Act"
  • *: Substring search. Example: "Metrological Services" measure* finds "Metrological Services" measures and "Metrological Services" measurement

If you enter more than one search term, the individual words are connected with an "AND".