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352 results:
41. Reference-free X-Ray Fluorescence analysis (XRF)  
Date: 02.10.2018
Percental score: 16 %
Reference-free X-Ray Fluorescence analysis (XRF) Dr. Burkhard Beckhoff Physikalisch-Technische Bundesanstalt 7.24 Röntgenspektrometrie Abbestraße 2–12 10587 Berlin burkhard.beckhoff@ptb.de (030)  
42. X-ray absorption fine structure spectroscopy (XAFS)  
Date: 02.10.2018
Percental score: 16 %
X-ray absorption fine structure spectroscopy (XAFS) Dr. Burkhard Beckhoff Physikalisch-Technische Bundesanstalt 7.24 Röntgenspektrometrie Abbestraße 2–12 10587 Berlin burkhard.beckhoff@ptb.de (030)  
43. Farfield Fourier Transform Infrared (FTIR)-Microspectroscopy  
Date: 02.10.2018
Percental score: 16 %
Farfield Fourier Transform Infrared (FTIR)-Microspectroscopy Dr. Burkhard Beckhoff Physikalisch-Technische Bundesanstalt 7.24 Röntgenspektrometrie Abbestraße  
44. Monte Carlo methods for simulating image contrast in SEM  
Date: 03.01.2018
Percental score: 16 %
Monte Carlo methods for simulating image contrast in SEM Dr. Tobias Klein Physikalisch-Technische Bundesanstalt 5.24 Elektronenmikroskopie Bundesallee  
45. Modular Monte Carlo simulation program  
Date: 29.03.2016
Percental score: 16 %
Modular Monte Carlo simulation program Iris Weidner Physikalisch-Technische Bundesanstalt 5.24 Elektronenmikroskopie 38116 Braunschweig iris.weidner@ptb.de (0531) 592-5201 (0531) 592-5205  
46. 273rd PTB Seminar  
Date: 25.11.2013
Percental score: 16 %
The 273rd PTB Seminar "VUV and EUV Metrology" was held in the Lecture Hall of the Helmholtz-Zentrum Berlin at the electron storage ring BESSY II in Berlin-Adlershof  
47. High resolution wavelength-dispersive X-Ray Fluorescence Analysis (RFA)  
Date: 02.10.2018
Percental score: 16 %
High resolution wavelength-dispersive X-Ray Fluorescence Analysis (RFA) Dr. Burkhard Beckhoff Physikalisch-Technische Bundesanstalt 7.24 Röntgenspektrometrie Abbestraße  
48. Scattering Type Scanning Near-field Optical Microscopy and Nano-FTIR Spectroscopy  
Date: 02.10.2018
Percental score: 15 %
Scattering Type Scanning Near-field Optical Microscopy and Nano-FTIR Spectroscopy Dr. Burkhard Beckhoff Physikalisch-Technische Bundesanstalt 7.24 Röntgenspektrometrie Abbestraße  
49. Monte Carlo methods for simulating image contrast in SEM  
Date: 03.01.2018
Percental score: 15 %
Monte Carlo methods for simulating image contrast in SEM Iris Weidner Physikalisch-Technische Bundesanstalt 5.24 Elektronenmikroskopie 38116 Braunschweig iris.weidner@ptb.de (0531) 592-5201 (0531)  
50. Devices  
Date: 22.04.2016
Percental score: 14 %
In addition to the numerous measurement devices that Working Group 6.25 has for calibrating secondary standards by means of industrial X-ray tubes, this Working Group also has access to various  
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