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335 results:
31. 2018 Piester ProcPTTI  
Date: 20.06.2019
Percental score: 2 %
2018 Piester ProcPTTI D. Piester et al.: PTB’s Time and Frequency Services 2017, Proc. Precise Time and Time Interval Meeting - ION PTTI 2018, 29 Jan - 1 Feb 2018, Reston, VA, USA, pp. 1-10. This is  
32. 2018 Weyers Geodetic methods to determine  
Date: 16.04.2018
Percental score: 1 %
2018 Weyers Geodetic methods to determine J Geod (2018) 92:487–516 https://doi.org/10.1007/s00190-017-1075-1 ORIGINAL ARTICLE Geodetic methods to determine the relativistic redshift at the level of  
33. 2019 Piester Bauch Metrologia56  
Date: 27.02.2019
Percental score: 3 %
2019 Piester Bauch Metrologia56 Page 1 of 15 Calibrated Optical Time Transfer of UTC(k) for Supervision of Telecom Networks Ł. Śliwczyński1, P. Krehlik1, J. Kołodziej1, H. Schnatz2, D. Piester2, A.  
34. 2019 UNIDO OIML CS online  
Date: 12.06.2019
Percental score: 2 %
2019 UNIDO OIML CS online CERTIFICATION OF MEASURING INSTRUMENTS 1 1 ACKNOWLEDGMENTS UNIDO gratefully acknowledges the dedicated work of Mr. Paul Dixon (OIML) and Mr. Grégory Glas (BEIS-UK),  
35. 2022 04 26 R Behrens Calibrations in new ICRU quantitites  
Date: 02.05.2022
Percental score: 10 %
2022 04 26 R Behrens Calibrations in new ICRU quantitites Calibrations and irradiations in terms of the newly proposed ICRU operational quantities for radiation protection in photon and beta  
36. 273rd PTB Seminar  
Date: 25.11.2013
Percental score: 16 %
The 273rd PTB Seminar "VUV and EUV Metrology" was held in the Lecture Hall of the Helmholtz-Zentrum Berlin at the electron storage ring BESSY II in Berlin-Adlershof  
37. 2 Ss-OWi 1041 Grundsatzentscheidung  
Date: 18.12.2014
Percental score: 4 %
2 Ss-OWi 1041 Grundsatzentscheidung 2 Ss-OWi 1041/14 (45 a OWi – 204 Js 9104/13 AG Friedberg) OBERLANDESGERICHT FRANKFURT AM MAIN BESCHLUSS In der  
38. 3D nano-metrology with X-ray fluorescence and scattering techniques  
Date: 03.03.2020
Percental score: 12 %
A new algorithm allows the fast reconstruction of atom distributions in 3D nanostructured surfaces Over the last years, PTB has developed a new method for atom-specific reconstruction of  
39. 4.21 Form and Wavefront Metrology  
Date: 03.06.2020
Percental score: 9 %
Our working group develops and applies measurement technologies for optical systems for measurements with the smallest possible measurement uncertainty. We determine form measurement with quantities  
40. 4.23 Optical Nanometrology  
Date: 20.01.2021
Percental score: 5 %
Overview on standards for nanometrology   http://www.nanoscale.ptb.de/nanoscale/nanoscale-standards.html http://www.nano-refmat.bam.de/en/ Linewidth calibrations on photomasks are offered  
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